Journal Article
Lee, C.-G.; Chae, B.-G.; Ro, I.-J.; Jang, K.; Kim, N.-K.; Ahn, J.-P.; Woods, E.; Ahn, J.; Park, S.; Gault, B. et al.; Kim, S.-H.: Performance evaluation of deep-ultraviolet laser-assisted Invizo 6000 and near-ultraviolet laser-assisted LEAP 5000 for a range of material systems. Ultramicroscopy
281, 114296 (2026)