The key to establish a fundamental understanding of the links between synthesis, microstructure and properties is to characterize materials on all hierarchical levels of microstructure. Advanced Transmission Electron Microscopy offers versatile techniques enabling the analysis of atomic arrangements, microchemistry, defect structures, interfacial phenomena and precipitate structures. The development and application of advanced TEM techniques, including atomic resolution aberration-corrected imaging, analytical TEM and in-situ TEM are major areas of research.
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