The structure of planar defects and defect phases in Laves phase alloys and their influence on hydrogen storage properties

Publications of Michal Dagan

Journal Article (2)

1.
Journal Article
Katnagallu, S.; Dagan, M.; Parviainen, S.; Nematollahi, G. A.; Grabowski, B.; Bagot, P. A. J.; Rolland, N.; Neugebauer, J.; Raabe, D.; Vurpillot, F. et al.; Moody, M. P.; Gault, B.: Impact of local electrostatic field rearrangement on field ionization. Journal of Physics D: Applied Physics 51 (10), 105601, pp. 1 - 10 (2018)
2.
Journal Article
Dagan, M.; Gault, B.; Smith, G. D. W.; Bagot, P. A. J.; Moody, M. P.: Automated Atom-By-Atom Three-Dimensional (3D) Reconstruction of Field Ion Microscopy Data. Microscopy and Microanalysis 23 (2), pp. 255 - 268 (2017)

Conference Paper (2)

3.
Conference Paper
Katnagallu, S.; Nematollahi, G. A.; Dagan, M.; Moody, M. P.; Grabowski, B.; Gault, B.; Raabe, D.; Neugebauer, J.: High Fidelity Reconstruction of Experimental Field Ion Microscopy Data by Atomic Relaxation Simulations. In: Proceedings of Microscopy & Microanaalysis 2017, Vol. 23, pp. 642 - 643. Microscopy and Microanalysis 2017, St. Louis, MO, USA, August 06, 2017 - August 10, 2017. Cambridge University Press, New York, NY, USA (2017)
4.
Conference Paper
Parviainen, S.; Dagan, M.; Katnagallu, S.; Gault, B.; Moody, M. P.; Vurpillot, F.: Atomistic Simulations of Surface Effects Under High Electric Fields. In: Proceedings of Microscopy & Microanalysis 2017, Vol. 23, pp. 644 - 645. Microscopy & Microanalysis 2017, St. Louis, Missouri, USA, August 06, 2017 - August 10, 2017. (2017)

Talk (2)

5.
Talk
Gault, B.; De Geuser, F.; Katnagallu, S.; Nematollahi, G. A.; Dagan, M.; Parviainen, S.; Rusitzka, A. K.; Johnson, E.; Sundell, G.; Andersson, M. et al.; Stephenson, L.; Neugebauer, J.; Moody, M. P.; Vurpillot, F.; Raabe, D.: Reconstructing field ion microscopy and atom probe data. Australian Atom Probe Workshop, Magnetic Island, Australia (2017)
6.
Talk
Gault, B.; Dagan, M.; Katnagallu, S.; De Geuser, F.; Vurpillot, F.; Raabe, D.; Moody, M. P.: Revisiting Field Ion Microscopy. TMS 2017, San Diego, CA, USA (2017)

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