Publications of John F. McGilp

Speiser, E.; Chandola, S.; Hinrichs, K.; Gensch, M.; Cobert, C.; Wippermann, S. M.; Schmidt, W. G.; Bechstedt, F.; Richter, W.; Fleischer, K. et al.; McGilp, J. F.; Esser, N. N.: Metal–insulator transition in Si(111)-(4x1)/(8x2)-In studied by optical spectroscopy. Physica Status Solidi B 247 (8), pp. 2033 - 2039 (2010)

Chandola, S.; Hinrichs, K.; Gensch, M.; Esser, N. N.; Wippermann, S. M.; Schmidt, W. G.; Bechstedt, F.; Fleischer, K.; McGilp, J. F.: Structure of Si(111)-In Nanowires Determined from the Midinfrared Optical Response. Physical Review Letters 102 (22), 226805 (2009)

Wippermann, S. M.; Schmidt, W. G.; Bechstedt, F.; Chandola, S.; Hinrichs, K.; Gensch, M.; Esser, N. N.; Fleischer, K.; McGilp, J. F.: Optical anisotropy of Si(111)-( 4x1)/( 8x2)-In nanowires calculated from first-principles. In: Physica Status Solidi C, Vol. 7, pp. 133 - 136. 12th International Conference on Formation of Semiconductor Interfaces, Weimar, Germany, July 05, 2009 - July 10, 2009. Wiley-VCH, Weinheim (2010)