Dehm, G.; Rühle, M.; Conway, H. D.; Raj, R.: A microindentation method for estimating interfacial shear strength and its use in studying the influence of titanium transition layers on the interface strength of epitaxial copper films on sapphire. Acta Materialia 45 (2), pp. 489 - 499 (1997)
Dehm, G.; Scheu, C.; Raj, R.; Rühle, M.: Growth, structure and interfaces of Cu and Cu/Ti thin films on (0001)alpha-Al2O3. Materials Science Forum 207-209 (1), pp. 217 - 220 (1996)
Dehm, G.; Raj, R.; Rühle, M.: Influence of Interfacial Layers on the Ultimate Shear Strength of Copper/Sapphire Interfaces. Materials Science Forum 207-209 (2), pp. 597 - 600 (1996)
Möbus, G.; Schumann, E.; Dehm, G.; Rühle, M.: Measurement of Coherency States of Metal-Ceramic Interfaces by HRTEM Image Processing. Physica Status Solidi A 150 (1), pp. 77 - 87 (1995)
Dehm, G.; Rühle, M.; Ding, G.; Raj, R.: Growth and Structure of Copper Thin Films Deposited on (0001) Sapphire by Molecular Beam Epitaxy. Philosophical Magazine B-Physics of Condensed Matter Statistical Mechanics Electronic Optical and Magnetic Properties 71 (6), pp. 1111 - 1124 (1995)
Kirchlechner, C.; Kečkéš, J.; Micha, J.-S.; Dehm, G.: In Situ μLaue: Instrumental Setup for the Deformation of Micron Sized Samples. In: Neutrons and Synchrotron Radiation in Engineering Materials Science: From Fundamentals to Applications: Second Edition, pp. 425 - 438 (Eds. Staron, P.; Schreyer, A.; Clemens, H.; Mayer, S.). wiley, Hoboken, NJ, USA (2017)
Dehm, G.; Legros, M.; Kiener, D.: In-situ TEM Straining Experiments: Recent Progress in Stages and Small-Scale Mechanics. In: In-situ Electron Microscopy: SEM and TEM Applications in Physics, Chemistry and Materials Science, pp. 227 - 254 (Ed. Dehm, G.). Wiley VCH Verlag, Weinheim, Germany (2012)
Dehm, G.: Das Erich-Schmid-Institut für Materialwissenschaft (ESI) der Österreichischen Akademie der Wissenschaften. In: Handbuch der Nanoanalytik Steiermark, NanoNet Styria, 1 Ed., pp. 1 - 311 (Ed. Rom , W.). W. Rom, Graz, Austria (2005)
Dehm, G.; Müllner, P.: TEM-Observation of Dislocations in Polycrystalline Metal Films. In: The Encyclopedia of Materials: Science and Technology, Vol. 1, pp. 2329 - 2331 (Eds. Buschow, .H.J.; Cahn, R.; Flemings, M.; Ilschner, .; Kramer, E. et al.) (2001)
Microstructure of Ni2B Laser-Induced Surface-Alloyed α-Fe (Materials Resaerch Symposium Proceedings, Phase Transformations and Systems Driven far from Equilibrium, 481). MRS Fall Meeting´97, Boston, MA, USA. (2001)
Scientists of the Max-Planck-Institut für Eisenforschung pioneer new machine learning model for corrosion-resistant alloy design. Their results are now published in the journal Science Advances
Hydrogen in aluminium can cause embrittlement and critical failure. However, the behaviour of hydrogen in aluminium was not yet understood. Scientists at the Max-Planck-Institut für Eisenforschung were able to locate hydrogen inside aluminium’s microstructure and designed strategies to trap the hydrogen atoms inside the microstructure. This can…
Decarbonisation of the steel production to a hydrogen-based metallurgy is one of the key steps towards a sustainable economy. While still at the beginning of this transformation process, with multiple possible processing routes on different technological readiness, we conduct research into the related fundamental scientific questions at the MPIE.
The structures of grain boundaries (GBs) have been investigated in great detail. However, much less is known about their chemical features, owing to the experimental difficulties to probe these features at the near-atomic scale inside bulk material specimens. Atom probe tomography (APT) is a tool capable of accomplishing this task, with an ability…
ECCI is an imaging technique in scanning electron microscopy based on electron channelling applying a backscatter electron detector. It is used for direct observation of lattice defects, for example dislocations or stacking faults, close to the surface of bulk samples.
The project focuses on development and design of workflows, which enable advanced processing and analyses of various data obtained from different field ion emission microscope techniques such as field ion microscope (FIM), atom probe tomography (APT), electronic FIM (e-FIM) and time of flight enabled FIM (tof-FIM).