Publications of Peter Boesecke

Kečkéš, J.; Eiper, E.; Martinschitz, K. J.; Boesecke, P.; Gindl, W.; Dehm, G.: In situ X-ray Diffraction as a tool to probe mechanical phenomena down to the nano-scale. Advanced Engineering Materials 8 (11), pp. 1084 - 1088 (2006)