Gault, B.; Shoji Aota, L.; Krämer, M.; Kim, S.-H.: From impurity ingress to high-performance doping: A perspective on atom probe tomography in energy materials. Scripta Materialia 262, 116648 (2025)
Camuti, L.; Kim, S.-H.; Podjaski, F.; Vega-Paredes, M.; Mingers, A. M.; Acartürk, T.; Starke, U.; Lotsch, B. V.; Scheu, C.; Gault, B.et al.; Zhang, S.: Kinetics and direct imaging of electrochemically formed palladium hydride for efficient hydrogen evolution reaction. Physics > Chemical Physics (2025)
Kraemer, M.; Favelukis, B.; Sokol, M.; Rosen, B. A.; Eliaz, N.; Kim, S.-H.; Gault, B.: Facilitating Atom Probe Tomography of 2D MXene Films by In Situ Sputtering. Microscopy and Microanalysis 30 (6), pp. 1057 - 1065 (2024)
Jang, K.; Kim, M.-Y.; Jung, C.; Kim, S.-H.; Choi, D.; Park, S.-C.; Scheu, C.; Choi, P.-P.: Direct Observation of Trace Elements in Barium Titanate of Multilayer Ceramic Capacitors Using Atom Probe Tomography. Microscopy and Microanalysis 30 (6), pp. 1047 - 1056 (2024)
Sharma, V. M.; Svetlizky, D.; Das, M.; Tevet, O.; Krämer, M.; Kim, S.-H.; Gault, B.; Eliaz, N.: Microstructure and mechanical properties of bulk NiTi shape memory alloy fabricated using directed energy deposition. Additive Manufacturing 86, 104224 (2024)
Krämer, M.; Favelukis, B.; El-Zoka, A.; Sokol, M.; Rosen, B. A.; Eliaz, N.; Kim, S.-H.; Gault, B.: Near-Atomic Scale Perspective on the Oxidation of Ti3C2Tx MXenes: Insights from Atom Probe Tomography. Advanced Materials 23 (3), 2305183 (2024)
Woods, E.; Singh, M. P.; Kim, S.-H.; Schwarz, T.; Douglas, J. O.; El-Zoka, A.; Giulani, F.; Gault, B.: A versatile and reproducible cryo-sample preparation methodology for atom probe studies. Microscopy and Microanalysis, ozad120 29 (6), pp. 1992 - 2003 (2023)
International researcher team presents a novel microstructure design strategy for lean medium-manganese steels with optimized properties in the journal Science
In this project nanoprecipitates are designed via elastic misfit stabilization in Fe–Mn maraging steels by combining transmission electron microscopy (TEM) correlated atom probe tomography (APT) with ab initio simulations. Guided by these predictions, the Al content of the alloys is systematically varied...