Dehm, G.: Structure and Micromechanics of Materials. Materialwissenschaftliches Kolloquium ICAMS und Institut für Werkstoffe, RUB, Bochum, Germany (2013)
Dehm, G.: Probing deformation phenomena at small length scales. ECI on Nanomechanical Testing in Materials Research and Development IV, Olhão, Portugal (2013)
Dehm, G.: Atomic resolution interface study of VN and Cu films on MgO using Cs corrected TEM. Microscopy Conference MC 2013, Regensburg, Germany (2013)
Dehm, G.: Struktur und Nano-/Mikromechanik von Materialien. Vorstandssitzung des Stahlinstituts VDEh und der Wirtschaftsvereinigung Stahl, Düsseldorf, Germany (2013)
Kirchlechner, C.; Liegl, W.; Motz, C.; Dehm, G.: X-ray μLaue: A novel view on fatigue damage at the micron scale. ECI on Nanomechanical Testing 2013, Olhão (Algarve), Portugal (2013)
Kirchlechner, C.; Motz, C.; Dehm, G.: A novel view on fatigue damage at the micron scale by X-ray µLaue diffraction. GDRi CNRS MECANO General Meeting on the Mechanics of Nano-Objects, MPIE, Düsseldorf, Germany (2013)
Marx, V. M.; Kirchlechner, C.; Cordill, M. J.; Dehm, G.: Deformation behavior of a Cr interlayer buried under Cu films on polyimide. GDRi CNRS MECANO General Meeting on the Mechanics of Nano-Objects, MPIE, Düsseldorf, Germany (2013)
Dehm, G.: Prospects and experimental constraints of nano/micro-mechanical testing in materials science. GDRiCNRSMecano General Meeting, Ecole des Mines, Paris, France (2012)
International researcher team presents a novel microstructure design strategy for lean medium-manganese steels with optimized properties in the journal Science
This project aims to investigate the influence of grain boundaries on mechanical behavior at ultra-high strain rates and low temperatures. For this micropillar compressions on copper bi-crystals containing different grain boundaries will be performed.
Within this project we investigate chemical fluctuations at the nanometre scale in polycrystalline Cu(In,Ga)Se2 and CuInS2 thin-flims used as absorber material in solar cells.
This project aims to develop a testing methodology for the nano-scale samples inside an SEM using a high-speed nanomechanical low-load sensor (nano-Newton load resolution) and high-speed dark-field differential phase contrast imaging-based scanning transmission electron microscopy (STEM) sensor.
The thorough, mechanism-based, quantitative understanding of dislocation-grain boundary interactions is a central aim of the Nano- and Micromechanics group of the MPIE [1-8]. For this purpose, we isolate a single defined grain boundary in micron-sized sample. Subsequently, we measure and compare the uniaxial compression properties with respect to…