Gault, B.: Can machine learning bring atom probe microscopy closer to analytical atomic-scale tomography. 12th International Symposium on Atomic Level Characterizations for New Materials and Devices (ALC 19), Kyoto, Japan (2019)
Kasian, O.; Schweinar, K.; Cherevko, S.; Gault, B.; Mayrhofer, K. J. J.: Correlating Atomic Scale Structure with Reaction Mechanisms: Electrocatalytic Evolution of Oxygen. 70th Annual Meeting of the International Society of Electrochemistry, Durban, South Africa (2019)
Gault, B.: An introduction to atom probe tomography: from fundamentals to atomic-scale insights into engineering materials. Rolls Royce Lunchtime Seminar, Derby, UK (2019)
Gault, B.: An introduction to atom probe tomography: from fundamentals to atomic-scale insights into engineering materials. Seminar, University of Manchester, Manchester, UK (2019)
Gault, B.: An introduction to atom probe tomography: from fundamentals to atomic-scale insights into engineering materials. Seminar, University of British Columbia, Vancouver, BC, Canada (2019)
International researcher team presents a novel microstructure design strategy for lean medium-manganese steels with optimized properties in the journal Science
This project aims to investigate the influence of grain boundaries on mechanical behavior at ultra-high strain rates and low temperatures. For this micropillar compressions on copper bi-crystals containing different grain boundaries will be performed.
Within this project we investigate chemical fluctuations at the nanometre scale in polycrystalline Cu(In,Ga)Se2 and CuInS2 thin-flims used as absorber material in solar cells.
This project aims to develop a testing methodology for the nano-scale samples inside an SEM using a high-speed nanomechanical low-load sensor (nano-Newton load resolution) and high-speed dark-field differential phase contrast imaging-based scanning transmission electron microscopy (STEM) sensor.
The thorough, mechanism-based, quantitative understanding of dislocation-grain boundary interactions is a central aim of the Nano- and Micromechanics group of the MPIE [1-8]. For this purpose, we isolate a single defined grain boundary in micron-sized sample. Subsequently, we measure and compare the uniaxial compression properties with respect to…