Kerns, R. D.; Balachandran, S.; Hunter, A. H.; Crimp, M. A.: Ultra-high spatial resolution selected area electron channeling patterns. Ultramicroscopy 210, 112915 (2020)
International researcher team presents a novel microstructure design strategy for lean medium-manganese steels with optimized properties in the journal Science
This project aims to develop a testing methodology for the nano-scale samples inside an SEM using a high-speed nanomechanical low-load sensor (nano-Newton load resolution) and high-speed dark-field differential phase contrast imaging-based scanning transmission electron microscopy (STEM) sensor.