Mayweg, D.; Morsdorf, L.; Wu, X.; Herbig, M.: The role of carbon in the white etching crack phenomenon in bearing steels. Acta Materialia 203, 116480 (2021)
Tung, P.-Y.; McEniry, E.; Herbig, M.: The role of electric current in the formation of white-etching-cracks. Philosophical Magazine 101 (1), pp. 59 - 76 (2021)
Morsdorf, L.; Mayweg, D.; Li, Y.; Diederichs, A.; Raabe, D.; Herbig, M.: Moving cracks form white etching areas during rolling contact fatigue in bearings. Materials Science and Engineering A: Structural Materials Properties Microstructure and Processing 771, 138659 (2020)
Qin, Y.; Li, J.; Herbig, M.: Microstructural origin of the outstanding durability of the high nitrogen bearing steel X30CrMoN15-1. Materials Characterization 159, 110049 (2020)
Kumar, A.; Dutta, A.; Makineni, S. K.; Herbig, M.; Petrov, R.; Sietsma, J.: In-situ observation of strain partitioning and damage development in continuously cooled carbide-free bainitic steels using micro digital image correlation. Materials Science and Engineering A: Structural Materials Properties Microstructure and Processing 757, pp. 107 - 116 (2019)
Kühbach, M.; Breen, A. J.; Herbig, M.; Gault, B.: Building a Library of Simulated Atom Probe Data for Different Crystal Structures and Tip Orientations Using TAPSim. Microscopy and Microanalysis 25 (2), pp. 320 - 330 (2019)
International researcher team presents a novel microstructure design strategy for lean medium-manganese steels with optimized properties in the journal Science
In this project we developed a phase-field model capable of describing multi-component and multi-sublattice ordered phases, by directly incorporating the compound energy CALPHAD formalism based on chemical potentials. We investigated the complex compositional pathway for the formation of the η-phase in Al-Zn-Mg-Cu alloys during commercial…
The fracture toughness of AuXSnY intermetallic compounds is measured as it is crucial for the reliability of electronic chips in industrial applications.
Within this project we investigate chemical fluctuations at the nanometre scale in polycrystalline Cu(In,Ga)Se2 and CuInS2 thin-flims used as absorber material in solar cells.