Devulapalli, V.; Bishara, H.; Ghidelli, M.; Dehm, G.; Liebscher, C.: Influence of substrates and e-beam evaporation parameters on the microstructure of nanocrystalline and epitaxially grown Ti thin films. Applied Surface Science 562, 150194 (2021)
Devulapalli, V.; Dehm, G.; Liebscher, C.: Unravelling grain boundary structures in Ti thin films using aberration-corrected transmission electron microscopy. MSE Darmdtadt (Virtual), Darmstadt, Germany (2020)
Devulapalli, V.; Hans, M.; Prithiv, T. S.; Schneider, J. M.; Dehm, G.; Liebscher, C.: Unravelling the atomic structure and segregation of Ʃ13 [0001] tilt grain boundaries in titanium by advanced STEM. Microscopy Conference 2021 & Multinational Conference on Microscopy 2021, Vienna, Austria (2021)
Devulapalli, V.; Frommeyer, L.; Ghidelli, M.; Liebscher, C.; Dehm, G.: From epitaxially grown thin films to grain boundary analysis in Cu and Ti. International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices, IAMNano, Düsseldorf, Germany (2019)
Ceremony on 16 April with the Minister for Culture and Science of North Rhine-Westphalia, Ina Brandes, the Lord Mayor of Düsseldorf, Stephan Keller, and the President of the Max Planck Society, Patrick Cramer