Kirchlechner, C.; Martinschitz, K. J.; Daniel, R.; Mitterer, C.; Donges, J.; Rothkirch, A.; Klaus, M.; Genzel, C.; Kečkéš, J.: X-ray diffraction analysis of three-dimensional residual stress fields reveals origins of thermal fatigue in uncoated and coated steel. Scripta Materialia 62 (10), pp. 774 - 777 (2010)

Kirchlechner, C.; Martinschitz, K. J.; Daniel, R.; Klaus, M.; Genzel, C.; Mitterer, C.; Kečkéš, J.: Residual stresses and thermal fatigue in CrN hard coatings characterized by high-temperature synchrotron X-ray diffraction. Thin Solid Films 518 (8), pp. 2090 - 2096 (2010)

Kapp, M.; Martinschitz, K. J.; Kečkéš, J.; Lackner, J.M.; Zizak, I.; Dehm, G.: Thermal stresses and microstructure of tungsten films on copper. BHM Berg- und Hüttenmännische Monatshefte 153 (7), pp. 273 - 277 (2008)

Eiper, E.; Kečkéš, J.; Martinschitz, K. J.; Zizak, I.; Cabié, M.; Dehm, G.: Size-independent stresses in Al thin films thermally strained down to -100°C. Acta Materialia 55 (6), pp. 1941 - 1946 (2007)

Kečkéš, J.; Eiper, E.; Martinschitz, K. J.; Boesecke, P.; Gindl, W.; Dehm, G.: In situ X-ray Diffraction as a tool to probe mechanical phenomena down to the nano-scale. Advanced Engineering Materials 8 (11), pp. 1084 - 1088 (2006)

Martinschitz, K. J.; Kirchlechner, C.; Daniel, R.; Maier, G.; Mitterer, C.; Kečkéš, J.: Temperature dependence of residual stress gradients in shot-peened steel coated with CrN. International Conference on stress evaluation using neutrons and synchrotron radiation, MECA SENS IV, Vienna; Austria, September 24, 2007 - September 26, 2007. Materials Science Forum 571-572, pp. 101 - 106 (2008)

Eiper, E.; Martinschitz, K. J.; Dehm, G.; Kečkéš, J.: Size effect in metallic thin films characterized by low-temperature X-ray diffraction. Gordon Research Conference on thin film & smallscale mechanical behavior , Colby College Waterville, Maine, USA (2006)