Johansen, M.; Singh, M. P.; Xu, J.; Asp, L. E.; Gault, B.; Liu, F.: Unravelling lithium distribution in carbon fibre electrodes for structural batteries with atom probe tomography. Carbon 225, 119091 (2024)
Woods, E.; Singh, M. P.; Kim, S.-H.; Schwarz, T.; Douglas, J. O.; El-Zoka, A.; Giulani, F.; Gault, B.: A versatile and reproducible cryo-sample preparation methodology for atom probe studies. Microscopy and Microanalysis, ozad120 29 (6), pp. 1992 - 2003 (2023)
Singh, M. P.; Woods, E.; Kim, S.-H.; Jung, C.; Aota, L. S.; Gault, B.: Facilitating the Systematic Nanoscale Study of Battery Materials by Atom Probe Tomography through in-situ Metal Coating. Batteries & Supercaps 7 (2), e202300403 (2023)
Woods, E.; Aota, L. S.; Schwarz, T.; Kim, S.-H.; Douglas, J. O.; Singh, M. P.; Gault, B.: In-situ cryogenic protective layers and metal coatings in cryogenic FIB. IMC20 - 20th International Microscopy Congress - Pre-congress workshop, Cryogenic Atom Probe Tomography, Busan, South Korea (2023)
International researcher team presents a novel microstructure design strategy for lean medium-manganese steels with optimized properties in the journal Science
In this ongoing project, we investigate spinodal fluctuations at crystal defects such as grain boundaries and dislocations in Fe-Mn alloys using atom probe tomography, electron microscopy and thermodynamic modeling [1,2].
The aim of the Additive micromanufacturing (AMMicro) project is to fabricate advanced multimaterial/multiphase MEMS devices with superior impact-resistance and self-damage sensing mechanisms.
The Ni- and Co-based γ/γ’ superalloys are famous for their excellent high-temperature mechanical properties that result from their fine-scaled coherent microstructure of L12-ordered precipitates (γ’ phase) in an fcc solid solution matrix (γ phase). The only binary Co-based system showing this special type of microstructure is the Co-Ti system…
We will investigate the electrothermomechanical response of individual metallic nanowires as a function of microstructural interfaces from the growth processes. This will be accomplished using in situ SEM 4-point probe-based electrical resistivity measurements and 2-point probe-based impedance measurements, as a function of mechanical strain and…