Salgin, B.; Hamou, F. R.; Rohwerder, M.: Monitoring surface ion mobility on aluminum oxide: Effect of chemical pretreatments. Electrochimica Acta 110, pp. 526 - 533 (2013)
Hamou, F. R.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.: Numerical simulation of probing the electric double layer by scanning electrochemical potential microscopy. Electrochimica Acta 55 (18), pp. 5210 - 5222 (2010)
Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.: Numerical Investigation of Electrode Surface Potential Mapping with Scanning Electrochemical Potential Microscopy. The 12th International Scanning Probe Microscopy Conference, Sapporo, Japan (2010)
Bashir, A.; Muglali, M. I.; Hamou, R. F.; Rohwerder, M.: SECPM Study: Influence of the Tip Material and Its Coating on the Accuracy of Potential Profiling Across Electrical Double Layer at Solid/Liquid Interface. 217th ECS Meeting, Vancouver, Canada (2010)
Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.: Numerical simulation of probing the electric double layer by scanning electrochemical Potential microscopy. 217th ECS Meeting, Vancouver, Canada (2010)
Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.: Numerical simulation of probing the electric double layer by scanning electrochemical potential microscopy. International Workshops on Surface Modification for Chemical and Biochemical Sensing, Przegorzaly, Poland (2009)
Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.: Screening effects in probing the double layer by scanning electrochemical potential microscopy. Comsol European Conference October 2009, Milan, Italy (2009)
Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.: Simulation of probing the electric double layer by scanning electrochemical potential microscopy (SECPM). 11th International Fischer Symposium on Microscopy in Electrochemistry, Benediktbeuern, Germany (2009)
Hamou, R. F.; Biedermann, P. U.; Blumenau, A. T.: FEM Simulation of the Scanning Electrochemical Potential Microscopy (SECPM). SurMat Seminar, Schloß Gnadenthal, Kleve, Germany (2008)
Hamou, R. F.; Erbe, A.; Rohwerder, M.: Screening effects in probing the double layer by scanning electrochemical potential microscopy. Comsol European Conference October 2009, Milan, Italy (2009)
Hamou, R. F.; Biedermann, P. U.; Rohwerder, M.; Blumenau, A. T.: FEM Simulation of the Scanning Electrochemical Potential Microscopy (SECPM). 2nd IMPRS-SurMat Workshop in Surface and Interface Engineering in Advanced Materials, Ruhr-Universität Bochum, Bochum, Germany (2008)
Hamou, F. R.: Numerical Investigation of Scanning Electrochemical Potential Microscopy (SECPM). Dissertation, Fakultät für Physik und Astronomie der Ruhr-Universität, Bochum, Germany (2010)
International researcher team presents a novel microstructure design strategy for lean medium-manganese steels with optimized properties in the journal Science
In collaboration with Dr. Edgar Rauch, SIMAP laboratory, Grenoble, and Dr. Wolfgang Ludwig, MATEIS, INSA Lyon, we are developing a correlative scanning precession electron diffraction and atom probe tomography method to access the three-dimensional (3D) crystallographic character and compositional information of nanomaterials with unprecedented…
Conventional alloy development methodologies which specify a single base element and several alloying elements have been unable to introduce new alloys at an acceptable rate for the increasingly specialised application requirements of modern technologies. An alternative alloy development strategy searches the previously unexplored central regions…
Adding 30 to 50 at.% aluminum to iron results in single-phase alloys with an ordered bcc-based crystal structure, so-called B2-ordered FeAl. Within the extended composition range of this intermetallic phase, the mechanical behavior varies in a very particular way.
This project aims to correlate the localised electrical properties of ceramic materials and the defects present within their microstructure. A systematic approach has been developed to create crack-free deformation in oxides through nanoindentation, while the localised defects are probed in-situ SEM to study the electronic properties. A coupling…
By using the DAMASK simulation package we developed a new approach to predict the evolution of anisotropic yield functions by coupling large scale forming simulations directly with crystal plasticity-spectral based virtual experiments, realizing a multi-scale model for metal forming.
The aim of this project is to correlate the point defect structure of Fe1-xO to its mechanical, electrical and catalytic properties. Systematic stoichiometric variation of magnetron-sputtered Fe1-xO thin films are investigated regarding structural analysis by transition electron microscopy (TEM) and spectroscopy methods, which can reveal the defect…