Zhang, S.; Scheu, C.: Evaluation of EELS spectrum imaging data by spectral components and factors from multivariate analysis. Microscopy 67 (suppl_1), pp. i133 - i141 (2018)
Hieke, S. W.; Dehm, G.; Scheu, C.: Annealing induced void formation in epitaxial Al thin films on sapphire (α-Al2O3). Acta Materialia 140, pp. 355 - 365 (2017)
International researcher team presents a novel microstructure design strategy for lean medium-manganese steels with optimized properties in the journal Science
In order to develop more efficient catalysts for energy conversion, the relationship between the surface composition of MXene-based electrode materials and its behavior has to be understood in operando. Our group will demonstrate how APT combined with scanning photoemission electron microscopy can advance the understanding of complex relationships…