Wu, X.; Erbe, A.; Fabritius, H.; Raabe, D.: Relation of ultrastructure and optical properties in the cuticle of beetles. Materials Science and Engineering MSE 2010, Darmstadt, Germany (2010)
Reithmeier, M.; Erbe, A.: Antireflective layers on thin metal films for mid‐infrared internal reflection spectroscopy. Optical Interference Coatings - Topical Meeting, Tucson, Arizona, USA (2010)
Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.: Numerical Investigation of Electrode Surface Potential Mapping with Scanning Electrochemical Potential Microscopy. The 12th International Scanning Probe Microscopy Conference, Sapporo, Japan (2010)
Reithmeier, M.; Vasan, G.; Erbe, A.: Optical engineering of interfaces for concurrent internal reflection infrared-spectroscopic and electrochemical applications. 109th Annual meeting of the German Bunsen Society of Physical Chemistry (Bunsentagung), Bielefeld, Germany (2010)
Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.: Numerical simulation of probing the electric double layer by scanning electrochemical Potential microscopy. 217th ECS Meeting, Vancouver, Canada (2010)
Reithmeier, M.; Erbe, A.: Dielectric layers for signal enhancement in ATR spectroscopy. Spring meeting of the German Physical Society, Regensburg, Germany (2010)
Vasan, G.; Erbe, A.: Finite element calculations of surface enhancement in attenuated total reflection infrared spectroscopy. Spring meeting of the German Physical Society, Regensburg, Germany (2010)
Vasan, G.; Erbe, A.: Finite element calculations of surface enhancement in attenuated total reflection infrared spectroscopy. Workshop Nano particles, nano structures and near field computation, Bremen, Germany (2010)
Erbe, A.; Sigel, R.: Ellipsometric light scattering for probing the interface of colloidal particles. Advanced Polarimetric Instrumentation, Palaiseau, France (2009)
Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.: Numerical simulation of probing the electric double layer by scanning electrochemical potential microscopy. International Workshops on Surface Modification for Chemical and Biochemical Sensing, Przegorzaly, Poland (2009)
Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.: Screening effects in probing the double layer by scanning electrochemical potential microscopy. Comsol European Conference October 2009, Milan, Italy (2009)
Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.: Simulation of probing the electric double layer by scanning electrochemical potential microscopy (SECPM). 11th International Fischer Symposium on Microscopy in Electrochemistry, Benediktbeuern, Germany (2009)
Rabe, M.; Baumgartner, L.-M.; Boyle, A. L.; Erbe, A.: Employing electro-responsive germanium interfaces to control amphipathic peptide adsorption – an in situ ATR IR study. 6th International Symposium on Surface Imaging/Spectroscopy at the Solid/Liquid Interface, Krakow, Poland (2021)
Rabe, M.; Rechmann, J.; Boyle, A. L.; Erbe, A.: Designing Electro Responsive Self-Assembled Monolayers Based on the Coiled-Coil Peptide Binding Motif. 17th International Conference on Organized Molecular Films” (ICOMF17), New York, NY, USA (2018)
Rabe, M.; Sarfraz, A.; Erbe, A.: Monitoring Oxide Layer Growth on Manganese Electrodes, by in situ Spectroscopic Ellipsometry and Raman Spectroscopy. 67th Annual Meeting of the ISE, Den Haag, The Netherlands (2016)
Pang, B.; Stratmann, M.; Vogel, D.; Erbe, A.; Rohwerder, M.: Characterization of electrochemical double layer formed on Au (111) electrode: a KPM, FTIR and APXPS investigation. 2nd Annual APXPS Workshop, Berkeley, CA, USA (2015)
International researcher team presents a novel microstructure design strategy for lean medium-manganese steels with optimized properties in the journal Science
This project aims to investigate the influence of grain boundaries on mechanical behavior at ultra-high strain rates and low temperatures. For this micropillar compressions on copper bi-crystals containing different grain boundaries will be performed.
Within this project we investigate chemical fluctuations at the nanometre scale in polycrystalline Cu(In,Ga)Se2 and CuInS2 thin-flims used as absorber material in solar cells.
This project aims to develop a testing methodology for the nano-scale samples inside an SEM using a high-speed nanomechanical low-load sensor (nano-Newton load resolution) and high-speed dark-field differential phase contrast imaging-based scanning transmission electron microscopy (STEM) sensor.
The thorough, mechanism-based, quantitative understanding of dislocation-grain boundary interactions is a central aim of the Nano- and Micromechanics group of the MPIE [1-8]. For this purpose, we isolate a single defined grain boundary in micron-sized sample. Subsequently, we measure and compare the uniaxial compression properties with respect to…