Luo, W.; Kirchlechner, C.; Dehm, G.; Stein, F.: A New Method to Study the Composition Dependence of Mechanical Properties of Laves. MRS Fall Meeting 2016, Boston, MA, USA (2016)
Dehm, G.: Mikromechanik: lokale Einblicke in die mechanischen Eigenschaften von Materialien. Eröffnung des Christian Doppler Labors für
Lebensdauer und Zuverlässigkeit von Grenzflächen in komplexen Mehrlagenstrukturen der Elektronik „RELAB“, Vienna, Austria (2015)
Dehm, G.: New insights into the mechanical behavior of interface controlled metals. Colloquium Materials Modelling, Institut für Materialprüfung, Werkstoffkunde und Festigkeitslehre (IMWF), Universität Stuttgart , Stuttgart, Germany (2015)
Dehm, G.; Imrich, P. J.; Malyar, N.; Kirchlechner, C.: Differences in deformation behavior of bicrystalline Cu micropillars containing different grain boundaries. MS&T 2015 (Materials Science and Technology) meeting, symposium entitled "Deformation and Transitions at Grain Boundaries", Columbus, OH, USA (2015)
Dehm, G.; Zhang, Z.; Völker, B.: Structure and strength of metal-ceramic interfaces: New insights by Cs corrected TEM and advances in miniaturized mechanical testing. MS&T 2015 (Materials Science and Technology) meeting, Symposium entitled "Structures and Properties of Grain Boundaries: Towards an atomic-scale understanding of ceramics", Columbus, OH, USA (2015)
Dehm, G.; Harzer, T. P.; Völker, B.; Imrich, P. J.; Zhang, Z.: Towards New Insights on Interface Controlled Materials by Advanced Electron Microscopy. Frontiers of Electron Microscopy in Materials Science Meeting (FEMMS 2015), Lake Tahoe, CA, USA (2015)
Dehm, G.; Jaya, B. N.; Raghavan, R.; Kirchlechner, C.: Probing deformation and fracture of materials with high spatial resolution. Euromat 2015 - Symposium on In-situ Micro- and Nano-mechanical, Characterization and Size Effects
, Warsaw, Poland (2015)
Dehm, G.: In situ nano- and micromechanics of materials. International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices – IAMNano 2015, Hamburg, Germany (2015)
Duarte, M. J.; Brinckmann, S.; Renner, F. U.; Dehm, G.: Nanomechanical testing under environmental conditins of Fe-based metallic glasses. 22st International Symposium on Metastable Amorphous and Nanostructured Materials, ISMANAM 2015, Paris, France (2015)
Hieke, S. W.; Dehm, G.; Scheu, C.: Temperature induced faceted hole formation in epitaxial Al thin films on sapphire. Understanding Grain Boundary Migration: Theory Meets Experiment, Günzburg/Donau, Germany (2015)
Malyar, N.; Kirchlechner, C.; Dehm, G.: Dislocation grain boundary interaction in bi-crystalline micro pillars studied by in situ SEM and in situ µLaue diffraction. ICM 12 - 12th International Conference on the Mechanical Behavior of Materials, Karlsruhe, Germany (2015)
International researcher team presents a novel microstructure design strategy for lean medium-manganese steels with optimized properties in the journal Science
In this project, we study the atomistic structure and phase transformations of tilt grain boundaries in Cu by using aberration-corrected scanning transmission electron microscope to build a relation to the transport properties of the grain boundaries via macroscopic tracer diffusion experiments. In the meantime, we address the impact of the grain…
Because of their excellent corrosion resistance, high wear resistance and comparable low density, Fe–Al-based alloys are an interesting alternative for replacing stainless steels and possibly even Ni-base superalloys. Recent progress in increasing strength at high temperatures has evoked interest by industries to evaluate possibilities to employ…
Here the focus lies on investigating the temperature dependent deformation of material interfaces down to the individual microstructural length-scales, such as grain/phase boundaries or hetero-interfaces, to understand brittle-ductile transitions in deformation and the role of chemistry or crystallography on it.
The goal of this project is to optimize the orientation mapping technique using four-dimensional scanning transmission electron microscopy (4D STEM) in conjunction with precession electron diffraction (PED). The development of complementary metal oxide semiconductor (CMOS)-based cameras has revolutionized the capabilities in data acquisition due to…