Ankah, G. N.; Meimandi, S.; Renner, F. U.: Dealloying of Cu3Pd Single Crystal Surfaces. Journal of the Electrochemical Society 160 (8), pp. C390 - C395 (2013)
Valtiner, M.; Ankah, G. N.; Bashir, A.; Renner, F. U.: Atomic force microscope imaging and force measurements at electrified and actively corroding interfaces: Challenges and novel cell design. Review of Scientific Instruments 82 (2), pp. 023703-1 - 023703-8 (2011)
Renner, F. U.; Ankah, G.; Pareek, A.: Surface Morphology Changes during Dealloying. Pacific Rim Meetin on Electrochemical and Solid-State Science PRIME 2012 / ECS 222, Honolulu, HI, USA (2012)
Ankah, G. N.; Renner, F. U.; Rohwerder, M.: Fundamental Investigations of the Corrosion of Binary Alloys. 59th Annual Meeting of the International Society of Electrochemistry, Sevilla, Spain (2008)
Ankah, G. N.: Investigations of the Selective Dissolution of Cu3Au(111): In-situ and Ex-situ Characterization. Dissertation, Fakultät für Maschinenbau der Ruhr-Universität, Bochum, Germany (2011)
International researcher team presents a novel microstructure design strategy for lean medium-manganese steels with optimized properties in the journal Science
In collaboration with Dr. Edgar Rauch, SIMAP laboratory, Grenoble, and Dr. Wolfgang Ludwig, MATEIS, INSA Lyon, we are developing a correlative scanning precession electron diffraction and atom probe tomography method to access the three-dimensional (3D) crystallographic character and compositional information of nanomaterials with unprecedented…
The unpredictable failure mechanism of White Etching Crack (WEC) formation in bearing steels urgently demands in-depth understanding of the underlying mechanisms in the microstructure. The first breakthrough was achieved by relating the formation of White Etching Areas (WEAs) to successive WEC movement.
The key to the design and construction of advanced materials with tailored mechanical properties is nano- and micro-scale plasticity. Significant influence also exists in shaping the mechanical behavior of materials on small length scales.