Publications of Gerhard Dehm

Dehm, G.; Zweck, J.: In-situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science. Wiley VCH Verlag, Weinheim, Germany (2012)

Kirchlechner, C.; Kečkéš, J.; Micha, J.-S.; Dehm, G.: In Situ μLaue: Instrumental Setup for the Deformation of Micron Sized Samples. In: Neutrons and Synchrotron Radiation in Engineering Materials Science: From Fundamentals to Applications: Second Edition, pp. 425 - 438 (Eds. Staron, P.; Schreyer, A.; Clemens, H.; Mayer, S.). wiley, Hoboken, NJ, USA (2017)

Dehm, G.; Legros, M.; Kiener, D.: In-situ TEM Straining Experiments: Recent Progress in Stages and Small-Scale Mechanics. In: In-situ Electron Microscopy: SEM and TEM Applications in Physics, Chemistry and Materials Science, pp. 227 - 254 (Ed. Dehm, G.). Wiley VCH Verlag, Weinheim, Germany (2012)

Dehm, G.: Das Erich-Schmid-Institut für Materialwissenschaft (ESI) der Österreichischen Akademie der Wissenschaften. In: Handbuch der Nanoanalytik Steiermark, NanoNet Styria, 1 Ed., pp. 1 - 311 (Ed. Rom , W.). W. Rom, Graz, Austria (2005)

Motz, C.; Kiener, D.; Schöberl, T.; Pippan, R.; Dehm, G.: Sekundärionen-Massenspektroskopie (SIMS) mittels FIB. In: Handbuch der Nanoanalytik Steiermark, NanoNet Styria, 1 Ed., pp. 1 - 311 (Ed. Rom, W.). W. Rom, Graz, Austria (2005)

Motz, C.; Kiener, D.; Schöberl, T.; Pippan, R.; Dehm, G.: Fokussierte Ionenstrahl-Technik (FIB) in der Mikro- und Nanomechanik. In: Handbuch der Nanoanalytik Steiermark, NanoNet Styria, 1 Ed., pp. 1 - 311 (Ed. Rom, W.). W. Rom, Graz, Austria (2005)

Pippan, R.; Vorhauer, A.; Wetscher, F.; Dehm, G.: Nanokristallisierung durch Hochverformung. In: Handbuch der Nanoanalytik Steiermark, NanoNet Styria, 1 Ed., pp. 1 - 311 (Ed. Rom, W.). W. Rom, Graz, Austria (2005)

Dehm, G.; Müllner, P.: TEM-Observation of Dislocations in Polycrystalline Metal Films. In: The Encyclopedia of Materials: Science and Technology, Vol. 1, pp. 2329 - 2331 (Eds. Buschow, .H.J.; Cahn, R.; Flemings, M.; Ilschner, .; Kramer, E. et al.) (2001)

Microstructure of Ni₂B Laser-Induced Surface-Alloyed α-Fe (Materials Resaerch Symposium Proceedings, Phase Transformations and Systems Driven far from Equilibrium, 481). MRS Fall Meeting´97, Boston, MA, USA. (2001)

Lee, J. S.; Riedel, J. L.; Kauffmann, A.; Guth, S.; Heilmaier, M.; Kanjilal, A.; Dehm, G.; Best, J. P.; Stein, F.: The effect of vacancy concentration on the micromechanical behaviour of B2 FeAl diffusion couples covering a wide range of compositions. In: Proceedings Intermetallics 2025, pp. 89 - 91. Intermetallics 2025, Educational Center Kloster Banz, Bad Staffelstein, Germany, September 29, 2025 - October 02, 2025. Conventus Congressmanagement & Marketing GmbH, Jena, Germany (2025) (2025)

Liu, G.; Kumar, K. S.; Liebscher, C.; Dehm, G.; Stein, F.: Defects in Off-stoichiometric Laves Phases: Atomic Arrangements in Dislocation Locks and Planar Defects. In: Proceedings Intermetallics 2025, pp. 162 - 164. Intermetallics 2025, Educational Center Kloster Banz, Bad Staffelstein, Germany, September 29, 2025 - October 02, 2025. Conventus Congressmanagement & Marketing GmbH, Jena, Germany (2025) (2025)

Best, J. P.; Rehman, U.; Tian, C.; Bishara, H.; Bhat, M. K.; Christiansen, L.; Stein, F.; Dehm, G.: Microscale Fracture Toughness Investigation of the Caal2 C15 Laves Phase. SSRN Conference Paper Series, (2023)

Bieler, S.; Kang, S. G.; Heußen, D.; Ramachandramoorthy, R.; Dehm, G.; Weinberg, K.: Investigation of copper lattice structures using a Split Hopkinson Pressure Bar. Proceedings of Applied Mathematics and Mechanics, Special Issue: 92nd Annual Meeting of the International Association of Applied Mathematics and Mechanics (GAMM) 21 (1), e202100155, (2021)

Rehman, U.; Tian, C.; Stein, F.; Best, J. P.; Dehm, G.: Fracture Toughness of the Intermetallic C15 Al₂Ca Laves Phase Determined using a Micropillar Splitting Technique. In: Intermetallics 2021, pp. 155 - 156. Intermetallics 2021, Kloster Banz, Bad Staffelstein, Germany, October 04, 2021 - October 08, 2021. (2021)

Luo, W.; Kirchlechner, C.; Dehm, G.; Stein, F.: Micromechanics of Co–Nb Laves Phases: Strength, Fracture Toughness, and Hadrness as Function of Composition and Crystal Structure. In: Joint EPRI – 123HIMAT International Conference on Advances in High-Temperature Materials, 2019, pp. 11 - 21 (Eds. Shingledecker, J.; Takeyama, M.). EPRI's 9th International Conf on Advances in Materials Technology for Fossil Power Plants and the 2nd International 123HiMAT Conf on High-Temperature Materials, Nagasaki, Japan, October 21, 2019 - October 24, 2019. (2019)

Luo, W.; Kirchlechner, C.; Dehm, G.; Stein, F.: Deformation of Micropillars of Cubic and Hexagonal NbCo₂ Laves Phases under Uniaxial Compression at Room Temperature. In: Proc. Intermetallics 2017, pp. 199 - 200 (Eds. Heilmaier, M.; Krüger, M.; Mayer, S.; Palm, M.; Stein, F.). Intermetallics 2017, Educational Center Kloster Banz, Bad Staffelstein, Germany, October 02, 2017 - October 06, 2017. Conventus Congressmanagement & Marketing GmbH, Jena, Germany (2017)

Hieke, S. W.; Willinger, M. G.; Wang, Z.-J.; Richter, G.; Dehm, G.; Scheu, C.: In situ electron microscopy – insights in solid state dewetting of epitaxial Al thin films on sapphire. In: Microscopy Conference 2017 (MC 2017) - Proceedings (Ed. Laue, M.). Microscopy Conference 2017 (MC 2017), Lausanne, Switzerland, August 21, 2017 - August 25, 2017. Universität Regensburg, Regensburg (2017)

Taniguchi, S.; Soler, R.; Kirchlechner, C.; Liebscher, C.; Taniyama, A.; Dehm, G.: In-situ TEM Study of Mechanical Size Effects in TiC Strengthened Steels. Microscopy & Microanalysis 2017, St. Louis, MO, USA, August 06, 2017 - August 10, 2017. Proceedings of Microscopy & Microanalysis 2017 23 (S1), pp. 732 - 733 (2017)

Hieke, S. W.; Dehm, G.; Scheu, C.: Investigation of solid state dewetting phenomena of epitaxial Al thin films on sapphire using electron microscopy. In: European Microscopy Congress 2016: Proceedings, pp. 203 - 204. The 16th European Microscopy Congress (EMC 2016), Lyon, France, August 28, 2016 - September 02, 2016. Wiley-VCH Verlag GmbH & Co KGaA (2016)

Liebscher, C.; Stoffers, A.; Cojocaru-Mirédin, O.; Gault, B.; Scheu, C.; Dehm, G.; Raabe, D.: Topological Impurity Segregation at Faceted Silicon Grain Boundaries Studied by Correlative Atomic-Resolution STEM and APT. In: Microscopy and Microanalysis, Vol. 22, pp. 46 - 47. 3rd Conference on In Situ and Correlative Electron Microscopy (CISCEM 2016) , Saarbrücken, Germany, October 11, 2016 - October 12, 2016. (2016)