Journal Article
Jeong, J.; Cautaerts, N.; Dehm, G.; Liebscher, C.: Automated Crystal Orientation Mapping by Precession Electron Diffraction-Assisted Four-Dimensional Scanning Transmission Electron Microscopy Using a Scintillator-Based CMOS Detector. Microscopy and Microanalysis
27 (5), pp. 1102 - 1112 (2021)