Dehm, G.; Harzer, T. P.; Völker, B.; Imrich, P. J.; Zhang, Z.: Towards New Insights on Interface Controlled Materials by Advanced Electron Microscopy. Frontiers of Electron Microscopy in Materials Science Meeting (FEMMS 2015), Lake Tahoe, CA, USA (2015)
Dehm, G.; Jaya, B. N.; Raghavan, R.; Kirchlechner, C.: Probing deformation and fracture of materials with high spatial resolution. Euromat 2015 - Symposium on In-situ Micro- and Nano-mechanical, Characterization and Size Effects
, Warsaw, Poland (2015)
Dehm, G.: In situ nano- and micromechanics of materials. International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices – IAMNano 2015, Hamburg, Germany (2015)
Duarte, M. J.; Brinckmann, S.; Renner, F. U.; Dehm, G.: Nanomechanical testing under environmental conditins of Fe-based metallic glasses. 22st International Symposium on Metastable Amorphous and Nanostructured Materials, ISMANAM 2015, Paris, France (2015)
Hieke, S. W.; Dehm, G.; Scheu, C.: Temperature induced faceted hole formation in epitaxial Al thin films on sapphire. Understanding Grain Boundary Migration: Theory Meets Experiment, Günzburg/Donau, Germany (2015)
Malyar, N.; Kirchlechner, C.; Dehm, G.: Dislocation grain boundary interaction in bi-crystalline micro pillars studied by in situ SEM and in situ µLaue diffraction. ICM 12 - 12th International Conference on the Mechanical Behavior of Materials, Karlsruhe, Germany (2015)
Dehm, G.: In situ nanocompression testing in the TEM: Challenges and benefits. Symposium Advanced Electron Microscopy for Materials Research, Erlangen, Germany (2015)
Kirchlechner, C.; Malyar, N.; Imrich, P. J.; Dehm, G.: Plastische Verformung an Korngrenzen: Neue Einblicke durch miniaturisierte Zug- und Druckversuche. 11. Tagung Gefüge und Bruch (2015), Leoben, Austria (2015)
Fink, C.; Brinckmann, S.; Shin, S.; Dehm, G.: Nanotribology and Microstructure Evolution in Pearlite. Frühjahrstagung der Sektion Kondensierte Materie der Deutschen Physikalischen Gesellschaft
, Berlin, Germany (2015)
Malyar, N.; Dehm, G.; Kirchlechner, C.: Insights into dislocation slip transfer by µLaue diffraction. Arbeitskreis-Treffen der Deutschen Gesellschaft für Materialkunde (DGM) e.V. „Rasterkraftmikroskopie und nanomechanische Methoden“, Darmstadt, Germany (2015)
Marx, V. M.; Kirchlechner, C.; Cordill, M. J.; Dehm, G.: The mechanical behavior of thin cobalt films on polyimide. Arbeitskreistreffen Rasterkraftmikroskopie und nanomechanische Methoden, TU Darmstadt, Darmstadt, Germny (2015)
Dehm, G.: Structure and Nano-/Micromechanics of Materials. Chemisch-Physikalisch-Technische Sektion der Max-Planck-Gesellschaft, Berlin, Germany (2015)
International researcher team presents a novel microstructure design strategy for lean medium-manganese steels with optimized properties in the journal Science
The aim of the work is to develop instrumentation, methodology and protocols to extract the dynamic strength and hardness of micro-/nano- scale materials at high strain rates using an in situ nanomechanical tester capable of indentation up to constant strain rates of up to 100000 s−1.
This project deals with the phase quantification by nanoindentation and electron back scattered diffraction (EBSD), as well as a detailed analysis of the micromechanical compression behaviour, to understand deformation processes within an industrial produced complex bainitic microstructure.
Within this project, we will use an infra-red laser beam source based selective powder melting to fabricate copper alloy (CuCrZr) architectures. The focus will be on identifying the process parameter-microstructure-mechanical property relationships in 3-dimensional CuCrZr alloy lattice architectures, under both quasi-static and dynamic loading…
Copper is widely used in micro- and nanoelectronics devices as interconnects and conductive layers due to good electric and mechanical properties. But especially the mechanical properties degrade significantly at elevated temperatures during operating conditions due to segregation of contamination elements to the grain boundaries where they cause…