Conference Paper
Zaefferer, S.; Konijnenberg, P.: Advanced analysis of 3D EBSD data obtained from FIB-EBSD tomography. In: Proceedings of M&M 2012, pp. 520 - 521 (Eds. Shields, J.; McKernan, S.; Brewer, L.; Ruiz, T.; Turnquist, D.). Microscopy & Microanalysis 2012, Phoenix, AZ, USA, July 29, 2012 - August 02, 2012. Microscopy Society of America (2012)