Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.: Screening effects in probing the double layer by scanning electrochemical potential microscopy. Comsol European Conference October 2009, Milan, Italy (2009)
Salgin, B.; Rohwerder, M.: A New Approach to Determine Ion Mobility Coefficients for Delamination Scenarios. electrochem09 and 50th Corrosion Science Symposium, Manchester, UK (2009)
Salgin, B.; Rohwerder, M.: A New Approach to Determine Ion Mobility Coefficients for Delamination Scenarios. 60th Annual Meeting of the International Meeting of the International Society of Electrochemistry, Beijing, China (2009)
Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.: Simulation of probing the electric double layer by scanning electrochemical potential microscopy (SECPM). 11th International Fischer Symposium on Microscopy in Electrochemistry, Benediktbeuern, Germany (2009)
Rohwerder, M.: Kelvin Probe Microscopy in Materials Science: Introduction, Overview and Future Perspectives. 23rd International Conference on Surface Modification Technologies (SMT 23), Chennai, India (2009)
Rohwerder, M.: Intelligent corrosion protection by organic coatings based on conducting polymers. Corrosion Cluster Workshop and Protection of Metals with Coatings, NIMS, Tsukuba, Japan (2009)
Swaminathan, S.; Spiegel, M.; Rohwerder, M.: Investigations on external/internal oxidation of quarternary model alloy during annealing in N2/H2: Role of dew point and dwelling time. 7th International Conference on the Microscopy of Oxidation, Chester, UK (2008)
Fenster, J. C.; Rohwerder, M.; Hassel, A. W.: Impedance-Titration: A Novel Method for Understanding the Kinetics of Corrosion in Aqueous Solutions. 59th Annual Meeting of the International Society of Electrochemistry, Sevilla, Spanien (2008)
Khan, T. R.; de la Fuenta, D.; Rohwerder, M.: Electrolytic co-deposition of SiO2 nanoparticles with zinc for improvement of corrosion protection. 59th Annual Meeting of the International Society of Electrochemistry, Seville, Spain (2008)
Stratmann, M.; Hassel, A. W.; Rohwerder, M.: Microelectrochemical Investigations of Interfaces and Surfaces of Advanced Materialks. 7th International Symposium on Electrochemical Micro- and Nanosystems, Ein-Gedi, Israel (2008)
Salgin, B.; Rohwerder, M.: Effects of Semiconducting Properties of Surface Oxide on the Delamination at the Polymer/Zinc Interface. SurMat Seminar, Kleve, Germany (2008)
Swaminathan, S.; Spiegel, M.; Rohwerder, M.: Effect of annealing conditions on the selective oxidation of quarternary model alloy. 4th International Conference on Diffusion in Solids and Liquids, Barcelona, Spain (2008)
Borodin, S.; Rohwerder, M.: Growth of high quality crystalline aluminium oxide films on Nb(110)/sapphire(11-20). 14th International Conference on Solid Films and Surfaces (ICSFS), Dublin, Ireland (2008)
Borodin, S.; Rohwerder, M.: Preparation of model single crystalline aluminium oxide films suitable for scanning tunnelling microscopy. DPG Tagung 2008, 72. Jahrestagung der Deutsche Physikalische Gesellschaft, Berlin, Germany (2008)
International researcher team presents a novel microstructure design strategy for lean medium-manganese steels with optimized properties in the journal Science
Within this project, we will use a green laser beam source based selective melting to fabricate full dense copper architectures. The focus will be on identifying the process parameter-microstructure-mechanical property relationships in 3-dimensional copper lattice architectures, under both quasi-static and dynamic loading conditions.
Oxides find broad applications as catalysts or in electronic components, however are generally brittle materials where dislocations are difficult to activate in the covalent rigid lattice. Here, the link between plasticity and fracture is critical for wide-scale application of functional oxide materials.
The fracture toughness of AuXSnY intermetallic compounds is measured as it is crucial for the reliability of electronic chips in industrial applications.
Within this project we investigate chemical fluctuations at the nanometre scale in polycrystalline Cu(In,Ga)Se2 and CuInS2 thin-flims used as absorber material in solar cells.