Cojocaru-Mirédin, O.; Schwarz, T.; Choi, P.; Würz, R.; Abou-Ras, D.; Dietrich, J.; Raabe, D.: Exploring the internal interfaces at the atomic-scale in Cu(In,Ga)Se2 thin-films solar cells. 1st EU APT Workshop, CEA/MINATEC, Grenoble, France (2012)
Cojocaru-Mirédin, O.; Choi, P.; Würz, R.; Abou-Ras, D.; Raabe, D.: Study on internal interfaces in CIGS thin-films solar cells using atom probe tomography. 27th EU PVSEC, Frankfurt, Germany (2012)
Schwarz, T.; Cojocaru-Mirédin, O.; Choi, P.; Würz, R.: Atomic-scale analysis of Cu(In,Ga)Se2 grain boundaries. 27th European Photovoltaic Solar Energy Conference and Exhibition, Frankfurt a. M., Germany (2012)
Schwarz, T.; Cojocaru-Mirédin, O.; Choi, P.; Würz, R.: Study of impurities redistribution inside the cigs absorber layer by atom probe tomography. Photovoltaic Technical Conference - Thin Film & Advanced Silicon Solutions 2012 (PVTC 2012), Aix-en-Provence, France (2012)
International researcher team presents a novel microstructure design strategy for lean medium-manganese steels with optimized properties in the journal Science
In this ongoing project, we investigate spinodal fluctuations at crystal defects such as grain boundaries and dislocations in Fe-Mn alloys using atom probe tomography, electron microscopy and thermodynamic modeling [1,2].
The aim of the Additive micromanufacturing (AMMicro) project is to fabricate advanced multimaterial/multiphase MEMS devices with superior impact-resistance and self-damage sensing mechanisms.
TiAl-based alloys currently mature into application. Sufficient strength at high temperatures and ductility at ambient temperatures are crucial issues for these novel light-weight materials. By generation of two-phase lamellar TiAl + Ti3Al microstructures, these issues can be successfully solved. Because oxidation resistance at high temperatures is…
We will investigate the electrothermomechanical response of individual metallic nanowires as a function of microstructural interfaces from the growth processes. This will be accomplished using in situ SEM 4-point probe-based electrical resistivity measurements and 2-point probe-based impedance measurements, as a function of mechanical strain and…