Li, Y. J.; Choi, P.; Goto, S.; Borchers, C.; Raabe, D.; Kirchheim, R.: Evolution of strength and microstructure during annealing of heavily cold-drawn 6.3 GPa hypereutectoid pearlitic steel wire. 53rd International Field Emission Symposium (IFES), Tascaloosa, AL, USA (2012)
Li, Y. J.; Choi, P.; Borchers, C.; Chen, Y.Z.; Goto, S.; Raabe, D.; Kirchheim, R.: Atom Probe Tomography characterization of heavily cold drawn pearlitic steel wire. 52nd International Field Emission Symposium (IFES), Sydney, Australia (2010)
Djaziri, S.; Li, Y.; Goto, S.; Kirchlechner, C.; Raabe, D.; Dehm, G.: Microstructural characterization of cold-drawn pearlitic steel wires at the nanometer scale. The Thin Film & Small Scale Mechanical Behavior Gordon Research Conference, Waltham, MA, USA (2014)
International researcher team presents a novel microstructure design strategy for lean medium-manganese steels with optimized properties in the journal Science
In this ongoing project, we investigate spinodal fluctuations at crystal defects such as grain boundaries and dislocations in Fe-Mn alloys using atom probe tomography, electron microscopy and thermodynamic modeling [1,2].
The aim of the Additive micromanufacturing (AMMicro) project is to fabricate advanced multimaterial/multiphase MEMS devices with superior impact-resistance and self-damage sensing mechanisms.
TiAl-based alloys currently mature into application. Sufficient strength at high temperatures and ductility at ambient temperatures are crucial issues for these novel light-weight materials. By generation of two-phase lamellar TiAl + Ti3Al microstructures, these issues can be successfully solved. Because oxidation resistance at high temperatures is…
We will investigate the electrothermomechanical response of individual metallic nanowires as a function of microstructural interfaces from the growth processes. This will be accomplished using in situ SEM 4-point probe-based electrical resistivity measurements and 2-point probe-based impedance measurements, as a function of mechanical strain and…