Koprek, A.; Cojocaru-Mirédin, O.; Würz, R.; Freysoldt, C.; Gault, B.; Raabe, D.: Cd and Impurity Redistribution at the CdS/CIGS Interface After Annealing of CIGS-Based Solar Cells Resolved by Atom Probe Tomography. IEEE Journal of Photovoltaics 7 (1), 7762819, pp. 313 - 321 (2017)
Stoffers, A.; Cojocaru-Mirédin, O.; Seifert, W.; Zaefferer, S.; Riepe, S.; Raabe, D.: Grain boundary segregation in multicrystalline silicon: correlative characterization by EBSD, EBIC, and atom probe tomography. Progress in Photovoltaics: Research and Applications 23 (12), pp. 1742 - 1753 (2015)
Cojocaru-Mirédin, O.; Choi, P.; Wuerz, R.; Raabe, D.: Exploring the p-n junction region in Cu(In,Ga)Se2 thin-film solar cells at the nanometer-scale. Applied Physics Letters 101 (18), pp. 181603-1 - 181603-5 (2012)
Choi, P.; Cojocaru-Mirédin, O.; Wuerz, R.: Compositional gradients and impurity distributions in CuInSe2 thin-film solar cells studied by atom probe tomography. Surface and Interface Analysis 44 (11-12), pp. 1386 - 1388 (2012)
International researcher team presents a novel microstructure design strategy for lean medium-manganese steels with optimized properties in the journal Science
This project aims to investigate the influence of grain boundaries on mechanical behavior at ultra-high strain rates and low temperatures. For this micropillar compressions on copper bi-crystals containing different grain boundaries will be performed.
The objective of the project is to investigate grain boundary precipitation in comparison to bulk precipitation in a model Al-Zn-Mg-Cu alloy during aging.
This project aims to develop a testing methodology for the nano-scale samples inside an SEM using a high-speed nanomechanical low-load sensor (nano-Newton load resolution) and high-speed dark-field differential phase contrast imaging-based scanning transmission electron microscopy (STEM) sensor.
The thorough, mechanism-based, quantitative understanding of dislocation-grain boundary interactions is a central aim of the Nano- and Micromechanics group of the MPIE [1-8]. For this purpose, we isolate a single defined grain boundary in micron-sized sample. Subsequently, we measure and compare the uniaxial compression properties with respect to…