Publications of Stefan Zaefferer

Stechmann, G.; Zaefferer, S.; Konijnenberg, P. J.; Raabe, D.; Gretener, C.; Kranz, L.; Perrenoud, J.; Bücheler, S.; Tiwari, A. N.: 3-Dimensional Microstructural and Crystallographic Characterization of CdTe Absorber Layers from CdTe/CdS Solar Cells Grown in Substrate Configuration. E-MRS, European Materials Research Society Conference 2014 , Lille, France (2014)

Konijnenberg, P. J.; Zaefferer, S.: GND Analysis of a Copper Micro Cantilever Beam. RMS EBSD 2014, London, UK (2014)

Herbig, M.; Raabe, D.; Li, Y.; Choi, P.; Zaefferer, S.; Goto, S.: High Throughput Quantification of Grain Boundary Segregation by Correlative TEM and APT. TMS 2014, Solid-State Interfaces III Symposium, San Diego, CA, USA (2014)

Herbig, M.; Raabe, D.; Li, Y.; Choi, P.-P.; Zaefferer, S.; Goto, S.: High Throughput Quantification of Grain Boundary Segregation by Correlative Transmission Electron Microscopy and Atom Probe Tomography. International Conference on Atom Probe Tomography & Microscopy 2014, Stuttgart, Germany (2014)

Konijnenberg, P. J.; Stechmann, G.; Zaefferer, S.; Raabe, D.: Advances in Analysis of 3D Orientation Data Sets Obtained by FIB-EBSD Tomography. 2nd International Congress on 3D Materials Science 2014, Annecy, France (2014)

Konijnenberg, P. J.; Zaefferer, S.; Raabe, D.: GND Analysis of a Copper Micro Cantilever Beam. Arbeitskreis EBSD 2014, Düsseldorf, Germany (2014)

Ram, F.; Khorashadizadeh, A.; Zaefferer, S.: Kikuchi Band Sharpness: A Measure for the Density of the Crystal Lattice Defects. MSE 2014, Darmstadt, Germany (2014)

Ram, F.; Zaefferer, S.: Accurate Kikuchi band localization and its application for diffraction geometry determination. HR-EBSD workshop, Imperial College, London, UK (2014)

Ram, F.; Zaefferer, S.: Plastic strain derivation and Kikuchi band localization by applying the Kikuchi bandlet method to electron backscatter Kikuchi Diffraction patterns. 17th ICOTOM, Dresden; Germany (2014)

Schemmann, L.; Zaefferer, S.: New insights into ferrite in dual phase steels by the usage of EBSD. EBSD 2014, London, UK (2014)

Stoffers, A.; Cojocaru-Mirédin, O.; Breitenstein, O.; Seifert, W.; Zaefferer, S.; Raabe, D.: Grain boundary characterization in multicrystalline silicon using joint EBSD, EBIC, and atom probe tomography. 40th IEEE Photovoltaic Specialists Conference, Denver, CO, USA (2014)

Stoffers, A.; Cojocaru-Mirédin, O.; Seifert, W.; Zaefferer, S.; Raabe, D.: A correlative EBSD, EBIC and APT study of grain boundary segregation in multicrystalline silicon. Atom Probe Tomography & Microscopy 2014, Stuttgart, Germany (2014)

Zaefferer, S.: SEM and TEM based orientation microscopy for investigation of recrystallization processes. CNRS summer school on recrystallization, Frejus, France (2014)

Zaefferer, S.; Ram, F.: The Kikuchi bandlet method: Application to plastic and elastic strain measurements. MSA EBSD 2014, Pittsburgh, USA (2014)

Herbig, M.; Raabe, D.; Li, Y. J.; Choi, P.; Zaefferer, S.; Goto, S.: Quantification of Grain Boundary Segregation in Nanocrystalline Material. Seminar at Department Microstructure Physics and Alloy Design, MPI für Eisenforschung, Düsseldorf, Germany (2013)

Jäpel, T.; Zaefferer, S.; Raabe, D.: Optimizing of cross-correlation methods for local residual stress measurements in slightly tensile deformed twip steels. Euromat 2013, Sevilla, Spain (2013)

Zaefferer, S.; Elhami, N. N.: Electron Channelling Contrast Imaging under controlled diffraction conditions, cECCI - Theory and Applications. CEMEF, Sofia-Antipolis, France (2013)

Konijnenberg, P. J.; Khorashadizadeh, A.; Zaefferer, S.; Raabe, D.: Analysis of 3D-EBSD Datasets Obtained by FIB Tomography. Microscopy and Microanalysis 2013, Indianapolis, IN, USA (2013)

Zaefferer, S.; Kleindiek, S.; Schock, K.; Volbert, B.: Combined Application of EBSD and ECCI Using a Versatile 5-Axes Goniometer in an SEM. Microscopy and Microanalysis 2013, Indianapolis, IN, USA (2013)

Zaefferer, S.; Elhami, N. N.; Konijnenberg, P. J.; Jäpel, T.: Quantitative Microstructure Characterization by Application of Advanced SEM-Based Electron Diffraction Techniques. Microscopy and Microanalysis 2013, Indianapolis, IN, USA (2013)