Cautaerts, N.; Rauch, E. F.; Jeong, J.; Dehm, G.; Liebscher, C.: Investigation of the orientation relationship between nano-sized G-phase precipitates and austenite with scanning nano-beam electron diffraction using a pixelated detector. Scripta Materialia 201, 113930 (2021)
Jeong, J.; Jang, W.-S.; Kim, K. H.; Kostka, A.; Gu, G.; Kim, Young, Y.-M.; Oh, S. H.: Crystallographic Orientation Analysis of Nanocrystalline Tungsten Thin Film Using TEM Precession Electron Diffraction and SEM Transmission Kikuchi Diffraction. Microscopy and Microanalysis 27 (2), pp. 237 - 249 (2021)
Kiener, D.; Jeong, J.; Alfreider, M.; Konetschnik, R.; Oh, S. H.: Prospects of using small scale testing to examine different deformation mechanisms in nanoscale single crystals - A case study in Mg. Crystals 11 (1), 61 (2021)
Jeong, J.: Advanced transmission electron microscopy of nanomaterials using In-situ TEM and precession electron diffraction. Seminar, Korea Institute of Industrial Technology (KITECH), Seoul, South Korea (2019)
Jeong, J.: Advanced transmission electron microscopy of nanomaterials using In-situ TEM and precession electron diffraction. Seminar, Korea Institute of Materials Science (KIMS), Seoul, South Korea (2019)
Jeong, J.: Advanced transmission electron microscopy of nanomaterials using In-situ TEM and precession electron diffraction. Seminar, Korea Institute of Science and Technology (KIST), Seoul, South Korea (2019)
Jeong, J.; Dehm, G.; Liebscher, C.: Advances in automatic TEM based orientation mapping with precession electron diffraction. KSM Annual Fall Conference 2019, Gyeongju, South Korea (2019)
Jeong, J.; Kim, J.; Kiener, D.; Oh, S. H.: In-situ TEM observation of twin-dominated deformation of Mg single crystals. KSM Annual Fall Conference 2019, Gyeongju, South Korea (2019)
Jeong, J.; Dehm, G.; Liebscher, C.: Advances in automatic TEM based orientation mapping with precession electron diffraction. Joint Max-Planck-Institut für Eisenforschung MPIE) / Ernst Ruska-Centre (ER-C) Workshop, Düsseldorf, Germany (2019)
Jeong, J.; Dehm, G.; Liebscher, C.: Advances in automatic TEM based orientation mapping with precession electron diffraction. International Workshop on Advanced In Situ Microscopies
of Functional Nanomaterials and Devices (IAMnano 2019), Düsseldorf, Germany (2019)
Scientists of the Max-Planck-Institut für Eisenforschung pioneer new machine learning model for corrosion-resistant alloy design. Their results are now published in the journal Science Advances
Smaller is stronger” is well known in micromechanics, but the properties far from the quasi-static regime and the nominal temperatures remain unexplored. This research will bridge this gap on how materials behave under the extreme conditions of strain rate and temperature, to enhance fundamental understanding of their deformation mechanisms. The…
The prediction of materials properties with ab initio based methods is a highly successful strategy in materials science. While the working horse density functional theory (DFT) was originally designed to describe the performance of materials in the ground state, the extension of these methods to finite temperatures has seen remarkable…
This work led so far to several high impact publications: for the first time nanobeam diffraction (NBD) orientation mapping was used on atom probe tips, thereby enabling the high throughput characterization of grain boundary segregation as well as the crystallographic identification of phases.
We plan to investigate the rate-dependent tensile properties of 2D materials such as HCP metal thin films and PbMoO4 (PMO) films by using a combination of a novel plan-view FIB based sample lift out method and a MEMS based in situ tensile testing platform inside a TEM.
In 2020, an interdepartmental software task force (STF) was formed to serve as a forum for discussion on topics related to software development and digital workflows at the MPIE. A central goal was to facilitate interdepartmental collaboration by co-developing and integrating workflows, aligning internally developed software, and rolling out…
ECCI is an imaging technique in scanning electron microscopy based on electron channelling applying a backscatter electron detector. It is used for direct observation of lattice defects, for example dislocations or stacking faults, close to the surface of bulk samples.
We will investigate the electrothermomechanical response of individual metallic nanowires as a function of microstructural interfaces from the growth processes. This will be accomplished using in situ SEM 4-point probe-based electrical resistivity measurements and 2-point probe-based impedance measurements, as a function of mechanical strain and…
Developing and providing accurate simulation techniques to explore and predict structural properties and chemical reactions at electrified surfaces and interfaces is critical to surmount materials-related challenges in the context of sustainability, energy conversion and storage. The groups of C. Freysoldt, M. Todorova and S. Wippermann develop…