Wang, X.; Grundmeier, G.: Thin multifunctional silver/fluorocarbon plasma polymer nanocomposite films on metals. The 9th International Conference on Nanostructured Materials, Rio de Janeiro, Brazil (2008)
Wang, X.; Grundmeier, G.: Combined spectroscopic, microscopic and electrochemical analysis of release properties of Ag-nanoparticles embedded in fluorocarbon plasma polymer films. The 58th Annual Meeting of the International Society of Electrochemistry, Banff, Canada (2007)
Wang, X.; Grundmeier, G.: Understanding of the Barrier and Release Properties of Thin Model Ag/HDFD-Plasma Polymer Nanocomposite Films. International Conference on Metallurgical Coatings and Thin Films (ICMCTF), San Diego, CA, USA (2007)
Grundmeier, G.; Wang, X.; Barranco, V.; Ebbinghaus, P.: Structure and barrier properties of thin plasma polymers and metal/plasma polymer nanocomposite film. ACHEMA, Frankfurt a. M., Germany (2006)
Wang, X.; Grundmeier, G.: Investigation of Structure and Stability of Silver Nanoparticles in Fluorocarbon Plasma Polymer Films. 13. Bundesdeutsche Fachtagung für Plasmatechnologie, Bochum, Germany (2007)
The aim of the Additive micromanufacturing (AMMicro) project is to fabricate advanced multimaterial/multiphase MEMS devices with superior impact-resistance and self-damage sensing mechanisms.
This project studies the mechanical properties and microstructural evolution of a transformation-induced plasticity (TRIP)-assisted interstitial high-entropy alloy (iHEA) with a nominal composition of Fe49.5Mn30Co10Cr10C0.5 (at. %) at cryogenic temperature (77 K). We aim to understand the hardening behavior of the iHEA at 77 K, and hence guide the future design of advanced HEA for cryogenic applications.
The aim of this project is to correlate the point defect structure of Fe1-xO to its mechanical, electrical and catalytic properties. Systematic stoichiometric variation of magnetron-sputtered Fe1-xO thin films are investigated regarding structural analysis by transition electron microscopy (TEM) and spectroscopy methods, which can reveal the defect…