Conference Paper
Cazottes, S.; Zhang, Z.; Dehm, G.: A structural characterization of a Cu/MgO (001) interface using Cs corrected TEM. In: 9th Multinational Microscopy Conference 2009, Materials Science, Vol.
3, pp. 69 - 70 (Eds. Kothleitner, G.; Leisch, M.). 9th Multinational Microscopy Conference 2009, Graz, Austria, August 30, 2009 - September 04, 2009. Verlag der Technischen Universität Graz, Graz, Austria (2009)