Journal Article
            Huo, H.; Bai, Y.; Benz, S.; Weintraut, T.; Wang, S.; Henss, A.; Raabe, D.; Janek, J.:  Decoupling the Effects of Interface Chemical Degradation and Mechanical Cracking in Solid-State Batteries with Silicon Electrode. Advanced Materials 
37 (7), 2415006 (2025)