Spatschek, R. P.; Eidel, B.: Driving forces for interface kinetics and phase field models. International Journal of Solids and Structures 50 (14-15), pp. 2424 - 2436 (2013)
Hüter, C.; Boussinot, G.; Brener, E. A.; Spatschek, R.: Solidification in syntectic and monotectic systems. Physical Review E 86 (2), pp. 021603-1 - 021603-7 (2012)
Guo, W.; Spatschek, R.; Steinbach, I.: An analytical study of the static state of multi-junctions in a multi-phase field model. Physica D 240 (4-5), pp. 382 - 388 (2011)
Hüter, C.; Boussinot, G.; Brener, E. A.; Spatschek, R. P.: Isothermal solidification in peritectic systems. In: Proceedings of the 2nd High Mangenese Steels Conference 2014 (2nd HMnS) (Eds. Bleck, W.; Raabe, D.). 2nd High Mangenese Steels Conference 2014 (2nd HMnS), Aachen, Germany, August 31, 2014 - September 04, 2014. (2014)
Fleck, M.; Brener, E. A.; Spatschek, R. P.; Eidel, B.: Elastic and plastic effects on solid-state transformations: A phase field study. International Journal of Materials Research 101 (4), pp. 462 - 466 (2010)
International researcher team presents a novel microstructure design strategy for lean medium-manganese steels with optimized properties in the journal Science
Within this project we investigate chemical fluctuations at the nanometre scale in polycrystalline Cu(In,Ga)Se2 and CuInS2 thin-flims used as absorber material in solar cells.
This project aims to develop a micromechanical metrology technique based on thin film deposition and dewetting to rapidly assess the dynamic thermomechanical behavior of multicomponent alloys. This technique can guide the alloy design process faster than the traditional approach of fabrication of small-scale test samples using FIB milling and…
The thorough, mechanism-based, quantitative understanding of dislocation-grain boundary interactions is a central aim of the Nano- and Micromechanics group of the MPIE [1-8]. For this purpose, we isolate a single defined grain boundary in micron-sized sample. Subsequently, we measure and compare the uniaxial compression properties with respect to…