Conference Paper
Parviainen, S.; Dagan, M.; Katnagallu, S.; Gault, B.; Moody, M. P.; Vurpillot, F.: Atomistic Simulations of Surface Effects Under High Electric Fields. In: Proceedings of Microscopy & Microanalysis 2017, Vol.
23, pp. 644 - 645. Microscopy & Microanalysis 2017, St. Louis, Missouri, USA, August 06, 2017 - August 10, 2017. (2017)