Journal Article
Jeong, J.; Jang, W.-S.; Kim, K. H.; Kostka, A.; Gu, G.; Kim, Young, Y.-M.; Oh, S. H.: Crystallographic Orientation Analysis of Nanocrystalline Tungsten Thin Film Using TEM Precession Electron Diffraction and SEM Transmission Kikuchi Diffraction. Microscopy and Microanalysis
27 (2), pp. 237 - 249 (2021)