Zhang, D.; Dehm, G.; Clemens, H.: Effect of heat treatments and hot-isostatic pressing on phase transformations and microstructure in a β/B2 containing γ-TiAl based alloy. Scripta Materialia 42 (11), pp. 1065 - 1070 (2000)
Dehm, G.; Scheu, C.; Bamberger, M. S.: Microstructure of Iron Substrates Borided with Ni2B Particles by Laser-Induced Surface-Alloying. Zeitschrift für Metallkunde 90 (11), pp. 920 - 929 (1999)
Bidlingmaier, T.; Wanner, A.; Dehm, G.; Clemens, H.: Acoustic Emission during Room Temperature Deformation of a γ-TiAl Based Alloy. Zeitschrift für Metallkunde 90, pp. 581 - 587 (1999)
Dehm, G.; Scheu, C.; Rühle, M.; Raj, R.: Growth and Structure of Internal Cu/Al2O3 and Cu/Ti/Al2O3 Interfaces. Acta Materialia 46 (3), pp. 759 - 772 (1998)
Scheu, C.; Dehm, G.; Kaplan, W. D.; Wagner, F.; Claussen, N. E.: Microstructure and Phase Evolution of Niobium-Aluminide-Alumina Composites Prepared by Melt-Infiltration. Physica Status Solidi A 166 (1), pp. 241 - 255 (1998)
Dehm, G.; Scheu, C.; Möbus, G.; Brydson, R.; Rühle, M.: Synthesis of Analytical and High Resolution Transmission Electron Microscopy to Determine the Interface Structure of Cu/Al2O3. Ultramicroscopy 67 (1-4), pp. 207 - 217 (1997)
Dehm, G.; Rühle, M.; Conway, H. D.; Raj, R.: A microindentation method for estimating interfacial shear strength and its use in studying the influence of titanium transition layers on the interface strength of epitaxial copper films on sapphire. Acta Materialia 45 (2), pp. 489 - 499 (1997)
Dehm, G.; Scheu, C.; Raj, R.; Rühle, M.: Growth, structure and interfaces of Cu and Cu/Ti thin films on (0001)alpha-Al2O3. Materials Science Forum 207-209 (1), pp. 217 - 220 (1996)
Dehm, G.; Raj, R.; Rühle, M.: Influence of Interfacial Layers on the Ultimate Shear Strength of Copper/Sapphire Interfaces. Materials Science Forum 207-209 (2), pp. 597 - 600 (1996)
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