Publications of Jochen Schneider

Woods, E.; Saksena, A.; El-Zoka, A.; Stephenson, L.; Schwarz, T.; Singh, M. P.; Aota, L. S.; Kim, S.-H.; Schneider, J.; Gault, B.: Nanoporous Gold Thin Films as Substrates to Analyze Liquids by Cryo-atom Probe Tomography. Microscopy and Microanalysis 30 (6), pp. 1172 - 1180 (2024)

Patterer, L.; Mayer, E.; Mráz, S.; Pöllmann, P. J.; Hans, M.; Primetzhofer, D.; Souza Filho, I. R.; Springer, H.; Schneider, J.: Effect of Si on the hydrogen-based direct reduction of Fe₂O₃ studied by XPS of sputter-deposited thin-film model systems. Scripta Materialia 233, 115515 (2023)

Devulapalli, V.; Hans, M.; Prithiv, T. S.; Schneider, J. M.; Dehm, G.; Liebscher, C.: Microstructure, grain boundary evolution and anisotropic Fe segregation in (0001) textured Ti thin films. Acta Materialia 238, 118180 (2022)

Bishara, H.; Kontis, P.; Dehm, G.; Schneider, J. M.; Evertz, S.: Effect of hybridization in PdAlY-(Ni/Au/Ir) metallic glasses thin films on electrical resistivity. Scripta Materialia 214, 114681 (2022)

Evertz, S.; Schnabel, V.; Köhler, M.; Kirchlechner, I.; Kontis, P.; Chen, Y.-T.; Soler, R.; Jaya, B. N.; Kirchlechner, C.; Mušić, D. et al.; Gault, B.; Gault, B.; Schneider, J. M.; Raabe, D.; Dehm, G.: Review on Quantum Mechanically Guided Design of Ultra-Strong Metallic Glasses. Frontiers in Materials 7, 89 (2020)

Evertz, S.; Kirchlechner, I.; Soler, R.; Kirchlechner, C.; Kontis, P.; Bednarcik, J.; Gault, B.; Dehm, G.; Raabe, D.; Schneider, J. M.: Electronic structure based design of thin film metallic glasses with superior fracture toughness. Materials and Design 186, 108327 (2020)

Schnabel, V.; Jaya, B. N.; Köhler, M.; Mušić, D.; Kirchlechner, C.; Dehm, G.; Raabe, D.; Schneider, J. M.: Electronic hybridisation implications for the damage-tolerance of thin film metallic glasses. Scientific Reports 6, 36556 , pp. 1 - 12 (2016)

Neuß, D.; McCaroll, I.; Zhang, S.; Woods, E.; Delis, W. J.; Tanure, L.; Springer, H.; Sandlöbes, S.; Yang, J.; Todorova, M. et al.; Zander, D.; Scheu, C.; Schneider, J. M.; Hans, M.: High-resolution chemical and structural characterization of the native oxide scale on a Mg-based alloy. arXiv (2023)

Woods, E.; Saksena, A.; El-Zoka, A.; Stephenson, L.; Schwarz, T.; Singh, M. P.; Aota, L. S.; Kim, S.-H.; Schneider, J. M.; Gault, B.: Nanoporous gold thin films as substrates to analyze liquids by cryo-atom probe tomography. arXiv (2023)

Zhou, X.; Mathews, P.; Berkels, B.; Ahmad, S.; Alhassan, A. S. A.; Keuter, P.; Schneider, J. M.; Raabe, D.; Neugebauer, J.; Dehm, G. et al.; Hickel, T.; Scheu, C.; Zhang, S.: Constructing phase diagrams for defects by correlated atomic-scale characterization. arXiv (2023)