Cautaerts, N.; Rauch, E. F.; Jeong, J.; Dehm, G.; Liebscher, C.: Investigation of the orientation relationship between nano-sized G-phase precipitates and austenite with scanning nano-beam electron diffraction using a pixelated detector. Scripta Materialia 201, 113930 (2021)
Jeong, J.; Jang, W.-S.; Kim, K. H.; Kostka, A.; Gu, G.; Kim, Young, Y.-M.; Oh, S. H.: Crystallographic Orientation Analysis of Nanocrystalline Tungsten Thin Film Using TEM Precession Electron Diffraction and SEM Transmission Kikuchi Diffraction. Microscopy and Microanalysis 27 (2), pp. 237 - 249 (2021)
Kiener, D.; Jeong, J.; Alfreider, M.; Konetschnik, R.; Oh, S. H.: Prospects of using small scale testing to examine different deformation mechanisms in nanoscale single crystals - A case study in Mg. Crystals 11 (1), 61 (2021)
Jeong, J.: Advanced transmission electron microscopy of nanomaterials using In-situ TEM and precession electron diffraction. Seminar, Korea Institute of Industrial Technology (KITECH), Seoul, South Korea (2019)
Jeong, J.: Advanced transmission electron microscopy of nanomaterials using In-situ TEM and precession electron diffraction. Seminar, Korea Institute of Materials Science (KIMS), Seoul, South Korea (2019)
Jeong, J.: Advanced transmission electron microscopy of nanomaterials using In-situ TEM and precession electron diffraction. Seminar, Korea Institute of Science and Technology (KIST), Seoul, South Korea (2019)
Jeong, J.; Dehm, G.; Liebscher, C.: Advances in automatic TEM based orientation mapping with precession electron diffraction. KSM Annual Fall Conference 2019, Gyeongju, South Korea (2019)
Jeong, J.; Kim, J.; Kiener, D.; Oh, S. H.: In-situ TEM observation of twin-dominated deformation of Mg single crystals. KSM Annual Fall Conference 2019, Gyeongju, South Korea (2019)
Jeong, J.; Dehm, G.; Liebscher, C.: Advances in automatic TEM based orientation mapping with precession electron diffraction. Joint Max-Planck-Institut für Eisenforschung MPIE) / Ernst Ruska-Centre (ER-C) Workshop, Düsseldorf, Germany (2019)
Jeong, J.; Dehm, G.; Liebscher, C.: Advances in automatic TEM based orientation mapping with precession electron diffraction. International Workshop on Advanced In Situ Microscopies
of Functional Nanomaterials and Devices (IAMnano 2019), Düsseldorf, Germany (2019)
The aim of this project is to correlate the point defect structure of Fe1-xO to its mechanical, electrical and catalytic properties. Systematic stoichiometric variation of magnetron-sputtered Fe1-xO thin films are investigated regarding structural analysis by transition electron microscopy (TEM) and spectroscopy methods, which can reveal the defect…
The aim of this project is to develop novel nanostructured Fe-Co-Ti-X (X = Si, Ge, Sn) compositionally complex alloys (CCAs) with adjustable magnetic properties by tailoring microstructure and phase constituents through compositional and process tuning. The key aspect of this work is to build a fundamental understanding of the correlation between…
In this project, we aim to achieve an atomic scale understanding about the structure and phase transformation process in the dual-phase high-entropy alloys (HEAs) with transformation induced plasticity (TRIP) effect. Aberration-corrected scanning transmission electron microscopy (TEM) techniques are being applied ...
Femtosecond laser pulse sequences offer a way to explore the ultrafast dynamics of charge density waves. Designing specific pulse sequences may allow us to guide the system's trajectory through the potential energy surface and achieve precise control over processes at surfaces.
In this project, links are being established between local chemical variation and the mechanical response of laser-processed metallic alloys and advanced materials.
In this project, we investigate the phase transformation and twinning mechanisms in a typical interstitial high-entropy alloy (iHEA) via in-situ and interrupted in-situ tensile testing ...
Solitonic excitations with topological properties in charge density waves may be used as information carriers in novel types of information processing.