Woods, E.; Singh, M. P.; Kim, S.-H.; Schwarz, T.; Douglas, J. O.; El-Zoka, A.; Giulani, F.; Gault, B.: A versatile and reproducible cryo-sample preparation methodology for atom probe studies. Microscopy and Microanalysis, ozad120 29 (6), pp. 1992 - 2003 (2023)
Schwarz, T.; Yu, W.; Zhan, H.; Gault, B.; Gourlay, C.; McCarroll, I.: Uncovering Ce-rich clusters and their role in precipitation strengthening of an AE44 alloy. Scripta Materialia 232, 115498 (2023)
Woods, E.; Aota, L. S.; Schwarz, T.; Kim, S.-H.; Douglas, J. O.; Singh, M. P.; Gault, B.: In-situ cryogenic protective layers and metal coatings in cryogenic FIB. IMC20 - 20th International Microscopy Congress - Pre-congress workshop, Cryogenic Atom Probe Tomography, Busan, South Korea (2023)
Schwarz, T.: Atom probe tomography: from water to complex liquids to the application of studying liquid-solid interfaces at the near atomic level. APT&M 23, Leuven, Belgium (2023)
International researcher team presents a novel microstructure design strategy for lean medium-manganese steels with optimized properties in the journal Science
In this ongoing project, we investigate spinodal fluctuations at crystal defects such as grain boundaries and dislocations in Fe-Mn alloys using atom probe tomography, electron microscopy and thermodynamic modeling [1,2].
The aim of the Additive micromanufacturing (AMMicro) project is to fabricate advanced multimaterial/multiphase MEMS devices with superior impact-resistance and self-damage sensing mechanisms.
TiAl-based alloys currently mature into application. Sufficient strength at high temperatures and ductility at ambient temperatures are crucial issues for these novel light-weight materials. By generation of two-phase lamellar TiAl + Ti3Al microstructures, these issues can be successfully solved. Because oxidation resistance at high temperatures is…
We will investigate the electrothermomechanical response of individual metallic nanowires as a function of microstructural interfaces from the growth processes. This will be accomplished using in situ SEM 4-point probe-based electrical resistivity measurements and 2-point probe-based impedance measurements, as a function of mechanical strain and…