Dehm, G.; Jaya, B. N.; Raghavan, R.; Kirchlechner, C.: Probing deformation and fracture of materials with high spatial resolution. Euromat 2015 - Symposium on In-situ Micro- and Nano-mechanical, Characterization and Size Effects
, Warsaw, Poland (2015)
Malyar, N.; Kirchlechner, C.; Dehm, G.: Dislocation grain boundary interaction in bi-crystalline micro pillars studied by in situ SEM and in situ µLaue diffraction. ICM 12 - 12th International Conference on the Mechanical Behavior of Materials, Karlsruhe, Germany (2015)
Kirchlechner, C.; Malyar, N.; Imrich, P. J.; Dehm, G.: Plastische Verformung an Korngrenzen: Neue Einblicke durch miniaturisierte Zug- und Druckversuche. 11. Tagung Gefüge und Bruch (2015), Leoben, Austria (2015)
Malyar, N.; Dehm, G.; Kirchlechner, C.: Insights into dislocation slip transfer by µLaue diffraction. Arbeitskreis-Treffen der Deutschen Gesellschaft für Materialkunde (DGM) e.V. „Rasterkraftmikroskopie und nanomechanische Methoden“, Darmstadt, Germany (2015)
Marx, V. M.; Kirchlechner, C.; Cordill, M. J.; Dehm, G.: The mechanical behavior of thin cobalt films on polyimide. Arbeitskreistreffen Rasterkraftmikroskopie und nanomechanische Methoden, TU Darmstadt, Darmstadt, Germny (2015)
Jaya, B. N.; Kirchlechner, C.; Dehm, G.: Probing deformation and fracture of materials with high spatial resolution. EDSA 2015 – International Workshop on Stress Assisted Environmental Damage in Structural Materials, Chennai, India (2015)
Jaya, B. N.; Kirchlechner, C.; Dehm, G.: Are micro-fracture tests reliable? 2015 MRS Fall Meeting and Exhibit - Symposium T: Strength and Failure at the Micro and Nano-scale-From fundamentals to Applications
, Boston, MA, USA (2015)
Kirchlechner, C.: “What can we learn from X-ray µLaue diffraction and where do we need to be careful?”. Seminar Talk at Helmholtz-Zentrum Geesthacht, Geesthacht, Germany (2014)
Kirchlechner, C.: Local diffraction techniques to probe residual strains/stresses in materials. Theorie and Practice of Modern X-Ray Diffraction, Summer School, Ellwangen, Germany (2014)
Marx, V. M.; Cordill, M. J.; Kirchlechner, C.; Dehm, G.: In-situ stress measurements in thin films using synchrotron diffraction. Summer School: Theory and Practice of Modern Powder Diffraction, Tagungshaus Schönenberg, Ellwangen, Ellwangen, Germany (2014)
Kirchlechner, C.: New insights into the plasticity of micron sized objects by in situ µLaue diffraction. Lecture at Universität Münster, Münster, Germany (2014)
Jaya, B. N.; Kirchlechner, C.; Dehm, G.: Design and development of fracture property measurement techniques at the small scale. ICAMS (RUB), Bochum, Germany (2014)
Marx, V. M.; Kirchlechner, C.; Berger, J.; Cordill, M. J.; Dehm, G.: In-situ stress measurements in Cu films using synchrotron radiation. "Mechanical Issues for Flexible Electronics" Flex Workshop, Erich Schmid Institut, Leoben, Leoben, Austria (2014)
International researcher team presents a novel microstructure design strategy for lean medium-manganese steels with optimized properties in the journal Science
In this ongoing project, we investigate spinodal fluctuations at crystal defects such as grain boundaries and dislocations in Fe-Mn alloys using atom probe tomography, electron microscopy and thermodynamic modeling [1,2].
The aim of the Additive micromanufacturing (AMMicro) project is to fabricate advanced multimaterial/multiphase MEMS devices with superior impact-resistance and self-damage sensing mechanisms.
TiAl-based alloys currently mature into application. Sufficient strength at high temperatures and ductility at ambient temperatures are crucial issues for these novel light-weight materials. By generation of two-phase lamellar TiAl + Ti3Al microstructures, these issues can be successfully solved. Because oxidation resistance at high temperatures is…
We will investigate the electrothermomechanical response of individual metallic nanowires as a function of microstructural interfaces from the growth processes. This will be accomplished using in situ SEM 4-point probe-based electrical resistivity measurements and 2-point probe-based impedance measurements, as a function of mechanical strain and…