Gault, B.: Full determination of 3D atomic position by combining APT & EM. Scientific Directions for Future TEM, Forschungszentrum Jülich, Jülich, Germany (2016)
Gault, B.; Katnagallu, S.: Atom probe microscopy: a new playground for big data analysis? Workshop Big-Data-Driven Materials Science, Ringberg Castle, Rottach, Germany (2016)
Gault, B.; De Geuser, F.: A perspective on the ion projection in field ion & atom probe microscopy. Atom Probe Tomography & Microscopy 2016, Gyeongju, South Korea (2016)
Raabe, D.; Choi, P.-P.; Gault, B.; Ponge, D.; Yao, M.; Herbig, M.: Segregation engineering for self-organized nanostructuring of materials - from atoms to properties? APT&M 2016 - Atom Probe Tomography & Microscopy 2016 (55th IFES) , Gyeongju, South Korea (2016)
Kuzmina, M.; Gault, B.; Herbig, M.; Ponge, D.; Sandlöbes, S.; Raabe, D.: From grains to atoms: ping-pong between experiment and simulation for understanding microstructure mechanisms. Res Metallica Symposium, Department of Materials Engineering, KU Leuven, Leuven, The Netherlands (2016)
International researcher team presents a novel microstructure design strategy for lean medium-manganese steels with optimized properties in the journal Science
Electro-responsive interfaces alter their properties in response to an electric potential trigger. Hence, such 'smart' interfaces offer exciting possibilities for applications in, for instance, microfluidics, separation systems, biosensors and -analytics.