Conference Paper
Bischof , M.; Mayer, S.; Leitner, H.; Clemens , H.; Pranzas, K.; Staron, P.; Dehm, G.; Knabl , W.; Voiticek, A.; Geiger, E.: Microstructure and Mechanical Properties of Si and Y Doped Tantalum. In: Proceedings of the 16th International Plansee Seminar 2005, Vol.
1, pp. 489 - 503. 16th International Plansee Seminar 2005, Reutte, Austria, May 30, 2005 - June 03, 2005. (2005)