Rusitzka, A. K.; Stephenson, L.; Gremer, L.; Raabe, D.; Willbold, D.; Gault, B.: Getting insights to Alzheimer‘s disease by atom probe tomography. 6th International caesar conference, Overcoming Barriers — atomic-resolution and beyond: advances in molecular electron microscopy, Bonn, Germany (2017)
Kwiatkowski da Silva, A.; Ponge, D.; Inden, G.; Gault, B.; Raabe, D.: Physical Metallurgy of segregation, austenite reversion, carbide precipitation and related phenomena in medium Mn steels. Gordon Research Conference: Physical Metallurgy, Biddeford, ME, USA (2017)
Gault, B.: Graduate course on Atom Probe Tomography, as part of the Centre for Doctoral Training on Materials Charactisation. Lecture: SS 2024, Imperial College London, UK, 2024-04 - 2024-07
Gault, B.: Graduate course on Atom Probe Tomography, as part of the Centre for Doctoral Training on Materials Charactisation. Lecture: SS 2023, Imperial College London, UK, 2023-04 - 2023-07
Gault, B.: Graduate course on Atom Probe Tomography, as part of the Centre for Doctoral Training on Materials Charactisation. Lecture: SS 2022, Imperial College London, UK, 2022-04 - 2022-07
Gault, B.: Graduate course on Atom Probe Tomography, as part of the Centre for Doctoral Training on Materials Charactisation. Lecture: SS 2021, Imperial College London, UK, 2021-04 - 2021-07
Lee, C.-G.; Nallathambi, V.; Kang, T.; Aota, L. S.; Reichenberger, S.; El-Zoka, A.; Choi, P.-P.; Gault, B.; Kim, S.-H.: Magnetocaloric effect of Fe47.5Ni37.5Mn15 bulk and nanoparticles: A cost-efficient alloy for room temperature magnetic refrigeration. arXiv (2024)
Max Planck scientists design a process that merges metal extraction, alloying and processing into one single, eco-friendly step. Their results are now published in the journal Nature.
In order to prepare raw data from scanning transmission electron microscopy for analysis, pattern detection algorithms are developed that allow to identify automatically higher-order feature such as crystalline grains, lattice defects, etc. from atomically resolved measurements.