Peng, Z.; Choi, P.-P.; Gault, B.; Raabe, D.: Evaluation of analysis conditions for laser-pulsed atom probe tomography: example of cemented tungsten carbide. Microscopy and Microanalysis 23 (2), pp. 431 - 442 (2017)
Koprek, A.; Cojocaru-Mirédin, O.; Würz, R.; Freysoldt, C.; Gault, B.; Raabe, D.: Cd and Impurity Redistribution at the CdS/CIGS Interface After Annealing of CIGS-Based Solar Cells Resolved by Atom Probe Tomography. IEEE Journal of Photovoltaics 7 (1), 7762819, pp. 313 - 321 (2017)
Cairney, J. M.; Gault, B.; Larson, D. J.: Recognizing 60 years of achievements in field emission and atomic scale microscopy: Reflections on the International Field Emission Society. Materials Today 19 (4), pp. 182 - 183 (2016)
Max Planck scientists design a process that merges metal extraction, alloying and processing into one single, eco-friendly step. Their results are now published in the journal Nature.