Johansen, M.; Singh, M. P.; Gault, B.; Liu, F.: Suppressing Lithium Migration in a Carbon Fiber Negative Electrode During Atom Probe Tomography Analysis. Microscopy and Microanalysis 30 (6), pp. 1066 - 1073 (2024)
Johansen, M.; Singh, M. P.; Xu, J.; Asp, L. E.; Gault, B.; Liu, F.: Unravelling lithium distribution in carbon fibre electrodes for structural batteries with atom probe tomography. Carbon 225, 119091 (2024)
Woods, E.; Singh, M. P.; Kim, S.-H.; Schwarz, T.; Douglas, J. O.; El-Zoka, A.; Giulani, F.; Gault, B.: A versatile and reproducible cryo-sample preparation methodology for atom probe studies. Microscopy and Microanalysis, ozad120 29 (6), pp. 1992 - 2003 (2023)
Singh, M. P.; Woods, E.; Kim, S.-H.; Jung, C.; Aota, L. S.; Gault, B.: Facilitating the Systematic Nanoscale Study of Battery Materials by Atom Probe Tomography through in-situ Metal Coating. Batteries & Supercaps 7 (2), e202300403 (2023)
Woods, E.; Aota, L. S.; Schwarz, T.; Kim, S.-H.; Douglas, J. O.; Singh, M. P.; Gault, B.: In-situ cryogenic protective layers and metal coatings in cryogenic FIB. IMC20 - 20th International Microscopy Congress - Pre-congress workshop, Cryogenic Atom Probe Tomography, Busan, South Korea (2023)
This project targets to exploit or develop new methodologies to not only visualize the 3D morphology but also measure chemical distribution of as-synthesized nanostructures using atom probe tomography.
Multiple Exciton Generation (MEG) is a promising pathway towards surpassing the Shockley-Queisser limit in solar energy conversion efficiency, where an incoming photon creates a high energy exciton, which then decays into multiple excitons.