Stechmann, G.; Zaefferer, S.; Konijnenberg, P. J.: Microstructural and Electronic Characterization of CdTe Thin Film Solar Cells: A Correlative SEM-Based Approach. IAMNano, Port Elizabeth, South Africa (2016)
Stechmann, G.; Zaefferer, S.: Microstructural and Electronic Characterization of CdTe Thin Film Solar Cells: A Correlative SEM-Based Approach. IAMNano, Hamburg, Germany (2015)
Zaefferer, S.; Mandal, S.; Stechmann, G.; Bozzolo, N.: Correlative measurement of the 5-parameter grain boundary character and its physical and chemical properties. RMS EBSD 2014, London, UK (2014)
Stechmann, G.: A Study on the Microstructure Formation Mechanisms and Functional Properties of CdTe Thin Film Solar Cells Using Correlative Electron Microscopy and Atomistic Simulations. Dissertation, RWTH Aachen, Aachen, Germany (2017)
Stechmann, G.: Compatibility between Molten Salts and Materials in Concentrated Solar Power Plants. Diploma, École Nationale Supérieure de Chimie de Lille, Lille, France (2013)
Stechmann, G.: Crystallographic and Electronic Characterization of Grain Boundaries in Cd–Te Thin Film Solar Cell. Master, University of Lille I, University of Science and Technology, Lille, France (2013)
International researcher team presents a novel microstructure design strategy for lean medium-manganese steels with optimized properties in the journal Science
This project (B06) is part of the SFB 1394 collaborative research centre (CRC), focused on structural and atomic complexity, defect phases and how they are related to material properties. The project started in January 2020 and has three important work packages: (i) fracture analysis of intermetallic phases, (ii) the relationship of fracture to…
Grain boundaries (GBs) affect many macroscopic properties of materials. In the case of metals grain growth, Hall–Petch hardening, diffusion, and electrical conductivity, for example, are influenced or caused by GBs. The goal of this project is to investigate the different GB phases (also called complexions) that can occur in tilt boundaries of fcc…