Lymperakis, L.; Neugebauer, J.: Exploring the 5D configurational space of grain boundaries in aluminun: An ab-initio based multiscale analysis. MRS Fall Meeting, Boston, MA, USA (2006)
Wahn, M.; Neugebauer, J.: Generalized Wannier Functions: An efficient way to construct ab-initio tight-binding orbitals for group-III nitrides. 6th International Conference on Nitride Semiconductors, Bremen, Germany (2005)
Hickel, T.; Grabowski, B.; Neumann, K.; Neumann, K.-U.; Ziebeck, K. R. A.; Neugebauer, J.: Temperature dependent properties of Ni-rich Ni2MnGa. Materials Research Society fall meeting, Boston, MA, USA (2005)
Ismer, L.; Ireta, J.; Neugebauer, J.: Thermodynamic stability of the secondary structure of proteins: A DFT-GGA based vibrational analysis. IPAM-Workshop: Multiscale Modeling in Soft Matter and Bio-Physics, Los Angeles, CA, USA (2005)
Lymperakis, L.; Neugebauer, J.: Ab-initio based multiscale calculations of low-angle grain boundaries in Aluminium. Materials Research Society fall meeting, Boston, MA, USA (2005)
Neugebauer, J.: Application and Implementation of Electronic Structure Methods. Lecture: Ruhr-Universität Bochum, SS 2015, Bochum, Germany, April 01, 2015 - September 30, 2015
Neugebauer, J.: Application and Implementation of Electronic Structure Methods. Lecture: Ruhr-Universität Bochum, SS 2014, Bochum, Germany, April 01, 2014 - September 30, 2014
Neugebauer, J.: Application and Implementation of Electronic Structure Methods. Lecture: Ruhr-Universität Bochum, SS 2013 , Bochum, Germany, April 01, 2013 - September 30, 2013
Neugebauer, J.; Hickel, T.: Moderne Computersimulations-Methoden in der Festkörperphysik. Lecture: Hands-on-Tutorial, Ruhr-Universität Bochum, Bochum, Germany, September 20, 2010 - September 24, 2010
Max Planck scientists design a process that merges metal extraction, alloying and processing into one single, eco-friendly step. Their results are now published in the journal Nature.
Scientists of the Max-Planck-Institut für Eisenforschung pioneer new machine learning model for corrosion-resistant alloy design. Their results are now published in the journal Science Advances
In collaboration with Dr. Edgar Rauch, SIMAP laboratory, Grenoble, and Dr. Wolfgang Ludwig, MATEIS, INSA Lyon, we are developing a correlative scanning precession electron diffraction and atom probe tomography method to access the three-dimensional (3D) crystallographic character and compositional information of nanomaterials with unprecedented…
A high degree of configurational entropy is a key underlying assumption of many high entropy alloys (HEAs). However, for the vast majority of HEAs very little is known about the degree of short-range chemical order as well as potential decomposition. Recent studies for some prototypical face-centered cubic (fcc) HEAs such as CrCoNi showed that…
Atom probe tomography (APT) is a material analysis technique capable of 3D compositional mapping with sub-nanometer resolution. The specimens for APT are shaped as sharp needles (~100 nm radius at the apex), so as to reach the necessary intense electrostatic fields, and are typically prepared via focused ion beam (FIB) based milling.
About 90% of all mechanical service failures are caused by fatigue. Avoiding fatigue failure requires addressing the wide knowledge gap regarding the micromechanical processes governing damage under cyclic loading, which may be fundamentally different from that under static loading. This is particularly true for deformation-induced martensitic…
We simulate the ionization contrast in field ion microscopy arising from the electronic structure of the imaged surface. For this DFT calculations of the electrified surface are combined with the Tersoff-Hamann approximation to electron tunneling. The approach allows to explain the chemical contrast observed for NiRe alloys.
Electron channelling contrast imaging (ECCI) is a powerful technique for observation of extended crystal lattice defects (e.g. dislocations, stacking faults) with almost transmission electron microscopy (TEM) like appearance but on bulk samples in the scanning electron microscope (SEM).