Dehm, G.: Atomic resolution interface study of VN and Cu films on MgO using Cs corrected TEM. Microscopy Conference MC 2013, Regensburg, Germany (2013)
Dehm, G.: Struktur und Nano-/Mikromechanik von Materialien. Vorstandssitzung des Stahlinstituts VDEh und der Wirtschaftsvereinigung Stahl, Düsseldorf, Germany (2013)
Kirchlechner, C.; Liegl, W.; Motz, C.; Dehm, G.: X-ray μLaue: A novel view on fatigue damage at the micron scale. ECI on Nanomechanical Testing 2013, Olhão (Algarve), Portugal (2013)
Kirchlechner, C.; Motz, C.; Dehm, G.: A novel view on fatigue damage at the micron scale by X-ray µLaue diffraction. GDRi CNRS MECANO General Meeting on the Mechanics of Nano-Objects, MPIE, Düsseldorf, Germany (2013)
Marx, V. M.; Kirchlechner, C.; Cordill, M. J.; Dehm, G.: Deformation behavior of a Cr interlayer buried under Cu films on polyimide. GDRi CNRS MECANO General Meeting on the Mechanics of Nano-Objects, MPIE, Düsseldorf, Germany (2013)
Dehm, G.: Prospects and experimental constraints of nano/micro-mechanical testing in materials science. GDRiCNRSMecano General Meeting, Ecole des Mines, Paris, France (2012)
Rashkova, B.; Moser, G.; Felber, H.; Grosinger, W.; Zhang, Z.; Motz, C.; Dehm, G.: A Novel Preparation Route to Obtain Micro-Bending Beams for In-situ TEM Studies. 9th Multinational Microscopy Conference 2009, Institute for Electron Microscopy Graz University of Technology , Graz, Austria (2009)
Bhat, M. K.; Frommeyer, L.; Prithiv, T. S.; Dehm, G.; Best, J. P.: Using small-scale mechanics to probe the origins of segregation-induced strengthening. Nanomechanical Testing in Materials Research and Development VIII, Split, Croatia (2022)
Frommeyer, L.; Brink, T.; Dehm, G.; Liebscher, C.: Atomic scale observations of Ag segregation in a high angle grain boundary in Cu. PICO 2022, Kasteel Vaalsbroek, The Netherlands (2022)
Scientists of the Max-Planck-Institut für Eisenforschung pioneer new machine learning model for corrosion-resistant alloy design. Their results are now published in the journal Science Advances
Atom probe tomography (APT) is one of the MPIE’s key experiments for understanding the interplay of chemical composition in very complex microstructures down to the level of individual atoms. In APT, a needle-shaped specimen (tip diameter ≈100nm) is prepared from the material of interest and subjected to a high voltage. Additional voltage or laser…
Ever since the discovery of electricity, chemical reactions occurring at the interface between a solid electrode and an aqueous solution have aroused great scientific interest, not least by the opportunity to influence and control the reactions by applying a voltage across the interface. Our current textbook knowledge is mostly based on mesoscopic…
Recent developments in experimental techniques and computer simulations provided the basis to achieve many of the breakthroughs in understanding materials down to the atomic scale. While extremely powerful, these techniques produce more and more complex data, forcing all departments to develop advanced data management and analysis tools as well as…
Integrated Computational Materials Engineering (ICME) is one of the emerging hot topics in Computational Materials Simulation during the last years. It aims at the integration of simulation tools at different length scales and along the processing chain to predict and optimize final component properties.
Data-rich experiments such as scanning transmission electron microscopy (STEM) provide large amounts of multi-dimensional raw data that encodes, via correlations or hierarchical patterns, much of the underlying materials physics. With modern instrumentation, data generation tends to be faster than human analysis, and the full information content is…
In order to prepare raw data from scanning transmission electron microscopy for analysis, pattern detection algorithms are developed that allow to identify automatically higher-order feature such as crystalline grains, lattice defects, etc. from atomically resolved measurements.