Publications of Ruben Bueno Villoro

Scheu, C.; Bueno Villoro, R.; Abdellaoui, L.; Mattlat, D. A.; Jung, C.; Gault, B.; Zhang, S.: New insights into thermoelectric materials through length-bridging characterization. Transverse Effects in Thermoelectric Systems 819. WE-Heraeus-Seminar, Bad Honnef, Germany (2024)

Jung, C.; Jang, K.; Zhang, S.; Bueno Villoro, R.; Choi, P.-P.; Scheu, C.: Sb-doping induced order to disorder transition enhances the thermal stability of NbCoSn1-xSbx half-Heusler semiconductors. The 20th International Microscopy Congress, PS-07.2. Microscopy of Semiconductor Materials and Devices, Busan, Republic of Korea (2023)

Bueno Villoro, R.: Electron microscopy investigations to understand the transport properties of energy materials. Physics Department, Technical University of Denmark, Kongens Lyngby, Denmark (2023)

Bueno Villoro, R.: Effect of grain boundary phases on the properties of half Heusler thermoelectrics. Northwestern University, Evanston, IL, USA (2023)

Bueno Villoro, R.: Application of NbTiFeSb half Heusler thermoelectric materials. Colloquium, Leibniz-Institut für Festkörper- und Werkstoffforschung, Dresden, Germany (2022)

Zhang, S.; Abdellaoui, L.; Bueno Villoro, R.; Jung, C.; Mattlat, D. A.; Scheu, C.: In situ microstructural observation of PbTe thermoelectrics by TEM. Colloquium, Leibniz-Institut für Festkörper- und Werkstoffforschung , Dresden, Germany (2022)

Scheu, C.; Abdellaoui, L.; Bueno Villoro, R.; Cojocaru-Mirédin, O.; Gault, B.; Luo, T.; Jung, C.; Yu, Y.; Zaefferer, S.; Zhang, S.: A scale bridging approach for analysis of extended defects in thermoelectric materials: From electron channeling contrast imaging, scanning transmission electron microscopy to atom probe tomography. ELMINA2022, Belgrade, Serbia (2022)

Zhang, S.; Abdellaoui, L.; Bueno Villoro, R.; Scheu, C.; Luo, T.; Gault, B.; Raabe, D.: Developing correlative and in situ microscopy to study structure-property relationships in thermoelectric materials. Modern electron microscopy and correlative techniques, online (2021)

Abdellaoui, L.; Yu, Y.; Zhang, S.; Luo, T.; Chen, Z.; Bueno Villoro, R.; Hanus, R.; Cojocaru-Mirédin, O.; Snyder, G. J.; Raabe, D. et al.; Pei, Y.; Scheu, C.: Parallel Dislocation Networks and Cottrell Atmospheres Reduce Thermal Conductivity of PbTe Thermoelectrics. Virtual Thermoelectric Conference 2021 (VCT 2021) (2021)

Bueno Villoro, R.; Luo, T.; Abdellaoui, L.; Scheu, C.; Gault, B.; Wood, M.; Snyder, G. J.; Zhang, S.: Effect of microstructure on the thermoelectric properties of Ti(Co,Fe)Sb half Heusler. Virtual Thermoelectric Conference (VCT2020), USA (2020)

Abdellaoui, L.; Yu, Y.; Zhang, S.; Bueno Villoro, R.; Luo, T.; Chen, Z.; Hanus, R.; Cojocaru-Mirédin, O.; Snyder, G. J.; Raabe, D. et al.; Pei, Y.; Scheu, C.: Detailed structure and chemistry of structural defects in PbTe based alloys. Virtual Thermoelectric Conference 2020 (VCT 2020) (2020)

Abdellaoui, L.; Zhang, S.; Rodenkirchen, C.; Zaefferer, S.; Bueno Villoro, R.; Guen, E.; Chapuis, P.-O.; Gomès, S.; Cojocaru-Mirédin, O.; Yu, Y. et al.; Amouyal, Y.; Raabe, D.; Snyder, G. J.; Scheu, C.: Effect of planar defects on the thermal conductivity of Ag_16.7Sb₃₀Te_53.3 bulk thermoelectric. 6th German/Korean Thermoelectric workshop, Daegu, South Korea (2019)

Abdellaoui, L.; Zhang, S.; Rodenkirchen, C.; Zaefferer, S.; Bueno Villoro, R.; Cojocaru-Mirédin, O.; Yu, Y.; Amouyal, Y.; Raabe, D.; Snyder, G. J. et al.; Scheu, C.: The importance of crystallographic defects in Ag_16.7Sb₃₀Te_53.3 thermoelectric bulk materials for the thermoelectric properties. EBSD conference 2019, National Physical Laboratory, Teddington, London, UK (2019)

Abdellaoui, L.; Zhang, S.; Rodenkirchen, C.; Zaefferer, S.; Bueno Villoro, R.; Guen, E.; Chapuis, P.-O.; Gomès, S.; Cojocaru-Mirédin, O.; Yu, Y. et al.; Amouyal, Y.; Raabe, D.; Snyder, G. J.; Scheu, C.: Correlation of Microstructures and Thermal Conductivity of the Thermoelectric Material Ag_16.7Sb₃₀Te_53.3. North American Thermoelectric workshop, Northwestern University, Eanston, Chicago, IL, USA (2019)

Abdellaoui, L.; Zhang, S.; Rodenkirchen, C.; Zaefferer, S.; Bueno Villoro, R.; Guen, E.; Chapuis, P.-O.; Gomès, S.; Cojocaru-Mirédin, O.; Yu, Y. et al.; Amouyal, Y.; Raabe, D.; Snyder, G. J.; Scheu, C.: The thermal conductivity of Ag_16.7Sb₃₀Te_53.3 bulk thermoelectric with high density of planar faults. 38th/4th International and Asian Conference on Thermoelectrics , Gyeongju, South Korea (2019)

Abdellaoui, L.; Zhang, S.; Zaefferer, S.; Rodenkirchen, C.; Bueno Villoro, R.; Cojocaru-Mirédin, O.; Amouyal, Y.; Yu, Y.; Raabe, D.; Scheu, C.: Influence of microstructure of Ag_16.7Sb₃₀Te_53.3 bulk thermoelectric on their performance. 37th | 16th International and European Conference on Thermoelectrics, Caen, France (2018)

Abdellaoui, L.; Zhang, S.; Zaefferer, S.; Rodenkirchen, C.; Bueno Villoro, R.; Cojocaru-Mirédin, O.; Amouyal, Y.; Yu, Y.; Raabe, D.; Scheu, C.: Influence of microstructure of Ag_16.7Sb₃₀Te_53.3 bulk thermoelectric on their performance. 1st International Meeting on Alternative & Green Energies (1st IMAGE'18), Mohammedia, Morocco (2018)

Mattlat, D. A.; Bueno Villoro, R.; Jung, C.; Naderloo, R. H.; He, R.; Nielsch, K.; Zavanelli, D.; Snyder, G. J.; Zhang, S.; Scheu, C.: Electron microscopy characterization of grain boundaries in Nb_1-xTi_xFeSb based half-Heusler thermoelectric materials. Electron Microscopy Congress (EMC) 2024, Copenhagen, Denmark (2024)

Mattlat, D. A.; Bueno Villoro, R.; Jung, C.; Scheu, C.; Zhang, S.; Naderloo, R. H.; Nielsch, K.; He, .; Zavanelli, D.; Snyder, G. J.: Effective doping of InSbat the grain boundaries in Nb_1-xTi_xFeSb based Half-Heusler thermoelectricsfor high electrical conductivity and Seebeckcoefficient. 40th International & 20th European Conference on Thermoelectrics, Krakow, Poland (accepted)

Bueno Villoro, R.; Zavanelli, D.; Jung, C.; Mattlat, D. A.; Naderloo, R. H.; Pérez, N. A.; Nielsch, K.; Snyder, G. J.; Scheu, C.; He, R. et al.; Zhang, S.: Grain Boundary Phases in NbFeSb Half-Heusler Alloys: A New Avenue to Tune Transport Properties of Thermoelectric Materials. Microscopy of semiconducting materials conference, Cambridge, UK (2023)