Devulapalli, V.; Hans, M.; Prithiv, T. S.; Schneider, J. M.; Dehm, G.; Liebscher, C.: Unravelling the atomic structure and segregation of Ʃ13 [0001] tilt grain boundaries in titanium by advanced STEM. Microscopy Conference 2021 & Multinational Conference on Microscopy 2021, Vienna, Austria (2021)
Sahu, R.; Völker, B.; Stelzer , B.; Chen, X.; Bliem , P.; Hans, M.; Primetzhofer, D.; Schneider, J. M.; Scheu, C.: Phase transitions in Cr2AlC thin films by in situ TEM heating experiment. Fifth Conference on Frontiers of Aberration Corrected Electron Microscopy, PICO 2019, Vaalsbroek, The Netherlands (2019)
Changizi, R.: Structural Analysis and Correlative Cathodoluminescence Investigations of Pr (doped) Niobates. Dissertation, Georessourcen und Materialtechnik, RWTH Aachen (2022)
Yilmaz, C.: Influence of Processing Parameters, Crystallography and Chemistry of Defects on the Microstructure and Texture Evolution in Grain-Oriented Electrical Steels. Dissertation, RWTH Aachen, Germany (2022)
Prithiv, T. S.: Grain boundary segregation of boron and carbon and their local chemical effects on the phase transformations in steels. Dissertation, Faculty of Georesources and Materials Engineering of the RWTH Aachen, Germany (2021)
Evertz, S.: Quantum mechanically guided design of mechanical properties and topology of metallic glasses. Dissertation, Fakultät für Georessourcen und Materialtechnik, RWTH Aachen (2020)
Keuter, P.: Design of materials with anomalous thermophysical properties and desorption-assisted phase formation of intermetallic thin films. Dissertation, RWTH Aachen University (2020)
Sysoltseva, M.: Characterization of aerosols and nanoparticles released during various indoor and outdoor human activities. Dissertation, RWTH Aachen University (2018)
Max Planck scientists design a process that merges metal extraction, alloying and processing into one single, eco-friendly step. Their results are now published in the journal Nature.
Scientists of the Max-Planck-Institut für Eisenforschung pioneer new machine learning model for corrosion-resistant alloy design. Their results are now published in the journal Science Advances
In collaboration with Dr. Edgar Rauch, SIMAP laboratory, Grenoble, and Dr. Wolfgang Ludwig, MATEIS, INSA Lyon, we are developing a correlative scanning precession electron diffraction and atom probe tomography method to access the three-dimensional (3D) crystallographic character and compositional information of nanomaterials with unprecedented…
A high degree of configurational entropy is a key underlying assumption of many high entropy alloys (HEAs). However, for the vast majority of HEAs very little is known about the degree of short-range chemical order as well as potential decomposition. Recent studies for some prototypical face-centered cubic (fcc) HEAs such as CrCoNi showed that…
Atom probe tomography (APT) is a material analysis technique capable of 3D compositional mapping with sub-nanometer resolution. The specimens for APT are shaped as sharp needles (~100 nm radius at the apex), so as to reach the necessary intense electrostatic fields, and are typically prepared via focused ion beam (FIB) based milling.
About 90% of all mechanical service failures are caused by fatigue. Avoiding fatigue failure requires addressing the wide knowledge gap regarding the micromechanical processes governing damage under cyclic loading, which may be fundamentally different from that under static loading. This is particularly true for deformation-induced martensitic…
We simulate the ionization contrast in field ion microscopy arising from the electronic structure of the imaged surface. For this DFT calculations of the electrified surface are combined with the Tersoff-Hamann approximation to electron tunneling. The approach allows to explain the chemical contrast observed for NiRe alloys.
Electron channelling contrast imaging (ECCI) is a powerful technique for observation of extended crystal lattice defects (e.g. dislocations, stacking faults) with almost transmission electron microscopy (TEM) like appearance but on bulk samples in the scanning electron microscope (SEM).